A 12-Bit, 100 MS/s SAR ADC Based on a Bridge Capacitor Array with Redundancy and Non-Linearity Calibration in 28 nm CMOS

Abstract

This paper presents a 12-bit, 100 MS/s successive approximation register (SAR) analog-to-digital converter (ADC) based on a bridge capacitor array with redundancy and non-linearity calibration. The differential non-linearity calibration method was proposed to compensate for the linearity, which is degraded by the parasitic capacitance of the bridge capacitor. To reduce the power dissipation and alleviate the settling error of the DAC capacitor array, a hybrid redundant scheme was proposed. A low-power, high-performance SAR ADC was implemented based on the proposed techniques. This SAR ADC prototype was implemented in 28 nm CMOS technology. Measurement results showed that the proposed SAR ADC could achieve a (signal-to-noise distortion ratio) SNDR of 61.46 dB and 58.82 dB at low and Nyquist input frequencies, respectively, resulting in figure of merits (FOMs) of 8.69 fJ/conversion and 11.8 fJ/conversion step, respectively. The SAR ADC core occupied an active area 0.0227 mm2.