A 10-Bit 400 MS/s Dual-Channel Time-Interleaved SAR ADC Based on Comparator Multiplexing

Abstract

This paper proposes a 10-bit 400 MS/s dual-channel time-interleaved (TI) successive approximation register (SAR) analog-to-digital converter (ADC) immune to offset mismatch between channels. A novel comparator multiplexing structure is proposed in our design to mitigate comparator offset mismatch between channels and improve ADC dynamic performance. Compared to traditional TI-SAR ADC utilizing offset calibration technique, hardware and power consumption overhead are minimized in our design. In addition, a split capacitive digital-to-analog converter (CDAC) and a double-tail dynamic comparator using the clock decoupling technique were applied to eliminate comparator common mode input voltage shift, ensuring conversion accuracy and boosting speed. A 400 MS/s 10-bit dual-channel TI-SAR ADC with comparator multiplexing was designed in 40 nm CMOS and compared to the conventional one. The simulated ADC ENOB and SFDR with 6σ offset mismatch were improved from 5.0-bit and 32.2 dB to 9.7-bit and 77.2 dB, respectively, confirming the merits of the proposed design compared to current state-of-the-art works.