Abstract
We describe the device and transport characteristics of amorphous zinc tin oxide thin‐film (ZTO) transistors. In samples with a sufficiently high mobility and at a high gate voltage, a crossover occurs from transport governed by thermal excitation of trapped charges to one where the charge carriers reside for a sufficiently long time in extended states. Very few semiconductors exhibit this range of behavior in the same device under different conditions. We also describe the correct methods to extract mobility values and ionization energies from current voltage characteristics.
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