5.2: New Technique of Measuring of the Jones Matrix for a Polarization Medium at Oblique Light Incidence

Abstract

We propose a new technique of measuring the Jones matrix for a polarization medium (ex. optical compensation film) based on ellipsometry experimental methodology at oblique light incidence. Unlike uniaxial, biaxial, and N-stacked birefringent layer models, this technique describes the medium's polarization properties directly without any assumptions about the internal microscopic physical parameters. The obtained Jones matrix gives an accurate prediction of viewing angle properties of the liquid crystal displays.