Chiral photonic crystals with an anisotropic defect layer: Oblique incidence

Abstract

In the present paper we consider some properties of defect modes in chiral photonic crystals with an anisotropic defect layer at oblique light incidence. The problem is solved by Ambartsumian’s layer addition method. We investigated some peculiarities of the discussed system’s reflection spectra of the oblique light incidence for both the minimum and essential influences of the dielectric boundaries. Then we investigated some particulars of the density of photonic states spectra. We also discussed some peculiarities of the light energy distribution in the system. We found out that at large incidence angles two defect modes arise in the two regions of the selective reflection, each in one respectively, meanwhile, none arises in the central region of the complete reflection. Our investigations show that it is possible to rather widely change the emission peak wavelength in the subject system doped with some laser dye, by changing the incidence angle.