Abstract
The electronic properties of stacked few-layer 2D materials are highly dependent on their precise structural arrangement. In article number 2100388, featured on the front cover, Michael J. Zachman, Miaofang Chi, and co-workers describe a four-dimensional scanning transmission electron microscopy technique that utilizes interference between Bragg discs to enable high-resolution mapping of picometer-scale structural reconstructions and measurement of average interlayer spacings in these materials.
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