Abstract
For light incident on an interface in the neighborhood of the critical angle, some energy is coupled into a lateral wave which is propagated along the interface region, close to the surface. Light is coupled back into the medium of incidence at all points and can be detected after an appreciable length of lateral wave path. This provides a sensitive method for detecting weak absorption, e.g. in very thin films or in cases where the absorbing region is confined to the immediate neighbourhood of the surface. The method is illustrated by applying it to the study of small concentrations of F-centres produced on a KCl crystal surface by electron bombardment.
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