4 × 4 Matrix formalisms for optics in stratified anisotropic media

Abstract

The 4 × 4 matrix formalisms developed respectively by Berreman [ D. W. Berreman , J. Opt. Soc. Am.62, 502 ( 1972)] and by Yeh [P. Yeh , J. Opt. Soc. Am.69, 742 ( 1979)] for the description of the ellipsometric properties of planar multilayer anisotropic media are compared. Features of both are used to provide a framework that is applicable to the calculation of ellipsometric properties of, e.g., stratified media that incorporate magnetic materials.