Abstract
We investigated the morphological and structural properties of 6,13 Pentacenequinone thin films (5–50 nm) grown by vacuum thermal evaporation on SiO 2 substrates with pre-patterned gold electrodes at room temperature using atomic force microscopy, scanning electron microscopy and X-ray diffraction. The X-ray diffraction always revealed the coexistence of two different crystalline phases, namely the bulk crystal phase and the thin film phase. A comparison of the diffraction data with atomic force microscopy and scanning electron microscopy measurements allowed assigning needle-like (compact) crystallites to the thin film (bulk) phase. The needle-like crystallites started to grow on flat two-dimensional islands lying on an initial wetting layer of Pentacenequinone. This is observed both on the bare silicon oxide substrate and on the polycrystalline gold electrodes.
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