Abstract
Understanding degradation of charge generation layer (CGL) is uprising issue for efficient and stable tandem devices. Here, we explored how the electrical characteristics of Li‐doped CGL device change according to different stress conditions comprehensively and found out thermal stress affects more severely than electrical stress via capacitance‐voltage and temperature‐dependent current density‐voltage measurements. The exponential trap distribution model analysis and Poisson and drift‐diffusion simulation informed that the degradation of electrical properties is attributed to Li diffusion and actual thermal diffusion of Li was experimentally observed by XPS depth
Published Version
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