Abstract
The Particle motion at near-surface is greatly important for efficiency in micro chip. In this paper, concentration distribution of polyethylene latex particle (diameter 100 nm) at near-surface in micro-channel is evaluated by total internal reflection fluorescence microscopy. And particle-wall interaction forces (van der Waals, electrostatic, and lift force) are investigated. The results show the concentration is the largest at specific location from the wall surface. The location is consistent with balance position of theoretical particle-wall interaction force in static fluid. In flow field, the largest value location is far away from wall as increasing velocity. This impact is lower with high-ionic strength.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
