Abstract

In many areas, the market for high-power electronic embedded systems requires them to be both highly compact and reliable. To strike the right compromise, manufacturers use component technologies that are increasingly compact, with well-defined lifetimes in the conditions specified by the supplier. However, in most cases, the reliability of the component depends on the operational profile of the system. In our case study, the technology considered is that of aluminum capacitors with liquid electrolyte, built in a compact cuboid case. Proper understanding of the reliability of this technology is a necessary step toward ensuring that the high-power electronic system operates properly. To this end, we conduct a reliability study that begins by studying the technology in order to identify the parameters that should be monitored when performing aging tests on this component. The data provided by this study are then used to establish a deterioration model as a function of the operational conditions.

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