Abstract
A GaP n+p-diode containing In0.5Ga0.5As quantum dots (QDs) and an AlP barrier is characterized electrically, together with two reference samples: a simple n+p-diode and an n+p-diode with AlP barrier. Localization energy, capture cross-section, and storage time for holes in the QDs are determined using deep-level transient spectroscopy. The localization energy is 1.14(±0.04) eV, yielding a storage time at room temperature of 230(±60) s, which marks an improvement of 2 orders of magnitude compared to the former record value in QDs. Alternative material systems are proposed for still higher localization energies and longer storage times.
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