Abstract
Position sensitive XAFS measurements by using the in-house X-ray spectrometer and the position sensitive X-ray detector were attempted. The in-house spectrometer produces monochromized divergent X-ray beam. Therefore, an extended direct-beam image projected on the detector can be taken, and its extension rate is depending on the arrangement of the sample and the detector. A position sensitive XAFS measurement was demonstrated by using Ni metal foil and NiO powder as a model sample. Ge(220) or Si(400) Johansson-type bent single-crystal was used as monochromator, and Mo and LaB6 were used as the target and filament, respectively. Tube voltage and current were operated at 16 kV and 100 mA (1.6 kW). XAFS spectra were measured by transmission-mode with sample set/reset method and required time of each experiment is about 6 hours in total. It was confirmed that metal and oxide spectra with enough quality for structural analysis were clearly separated by each position in the sample.
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