Abstract
An instrument has been developed which is capable of determining the chemical identity and position of atoms within a volume of order (20 nm) 3 in a material. Called the position-sensitive atom probe (POSAP), the instrument combines time-of-flight mass spectrometry and position-sensitive detection, in the configuration of a short flight path atom probe field-ion microscope. The POSAP makes it possible to reconstruct the three-dimensional nanometre-scale compositional variations in materials, and look at interfaces with sub-nanometre resolution. Apart from the gain in spatial resolution over atom probe analysis in previous designs, the POSAP opens up the possibility of totally new methods of characterisation, based on the morphology of phase microstructure on this scale. The three-dimensional data can also be compared directly with the results of modelling the atomic-scale processes occurring during the ageing of alloys.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
