Abstract
Thin silicon photodiodes are common X-ray beam diagnosis devices at synchrotron facilities. Here we present a new device featuring an extremely thin layer that allows X-ray transmission over 90% for energies above 10 keV. The diode has a radiation-hard silicon junction with silicon dioxide passivation and a protective entrance window. These outstanding features make this device suited for diagnostic applications in X-ray synchrotron beamlines. Hereby preliminary results of X-ray transmission, responsivity and uniformity are presented.
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