Abstract
101 デジタル画像相関法による次世代三次元積層チップ断面のひずみ計測を用いた非線形有限要素法解析精度の向上(OS1.電子デバイス・電子材料と計算力学(1),OS・一般セッション講演)
Published Version
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https://doi.org/10.1299/jsmecmd.2011.24.1
Copy DOIPublication Date: Jan 1, 2011 |
101 デジタル画像相関法による次世代三次元積層チップ断面のひずみ計測を用いた非線形有限要素法解析精度の向上(OS1.電子デバイス・電子材料と計算力学(1),OS・一般セッション講演)
Join us for a 30 min session where you can share your feedback and ask us any queries you have
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