1000 A cm − 1 in a 2 µm thick YBa2Cu3O7 − x film with BaZrO3 and Y2O3 additions

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We report here on significant improvements to the in-field and self-field critical current densities (Jc) of multilayer andsingle-layer YBa2Cu3O7 − x (YBCO)thick films with BaZrO3 (BZO) and Y2O3 additions. In the former case, the composite film consistedof a five-layer architecture with three YBCO layers and twoY2O3 interlayers in a totalthickness of 1.8 µm. Themultilayer film produced a Jc (75.6 K, self-field) of 4.3 MA cm − 2 (775 A cm − 1) anda minimum Jc (75.6 K, 1 T) of 1.0 MA cm − 2 (175 A cm − 1)over all field orientations in the maximum Lorentz force configuration. We achieved in a single-layer 2.0 µm thick film aJc (75.6 K, self-field)of 5.2 MA cm − 2 (1010 A/cm-w) and a minimum Jc (75.6 K,1 T) of 1.2 MA cm − 2 (234 A/cm-w) in the same measurement configuration. For both kinds of films, scanning transmission electronmicroscopy and transmission electron microscopy imaging were used to identify a uniformlydispersed second-phase microstructure consisting of short, tilted BZO nanorods and tiltedY2O3 nanoparticle layers. We attribute the enhanced performance of the thick YBCO films to theuniformity of the microstructure and the interaction of two different second-phase materialsduring film growth.