Abstract
This paper reports the effect of 100 MeV Ag swift heavy ion (SHI) irradiation with fluences ranging from 1 × 1011 to 1 × 1013 ions cm−2 on the optical properties of Ag0.10(Ge0.20Se0.80)0.90 thin films. It has been observed that the SHI irradiation changes the refractive index (n) and the oscillator strength (Ed). The data on the dispersion of the refractive index, n(λ), have been determined using the single-effective-oscillator model. We observed an increase in Ed and refractive index (n) at lower ion fluence (1 × 1011 ions cm−2), followed by the reversal in the trend at higher fluences. The optical gap has been determined by Tauc's plot. The values of decrease with ion fluence. Results have been explained in terms of the structural changes in thin films.
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