Abstract
The effect of 1 MeV Au+ ion irradiations on the layer stability of the Fe3O4-based films grown epitaxially on MgO(001) substrates was investigated by Rutherford backscattering spectroscopy (RBS) and RBS-Channelling (RBS-C). The ion mixing effect leads to an appearance of the additional FeO x layer and a large enlargement of the thickness of the mixed (Fe,Mg,O) layer in the interfaces. Au+ ions were found to be implanted deeply in the MgO substrate. RBS-C experiments have confirmed that the heavy metallic ion irradiations induce a disorder in the crystalline lattice.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Advances in Natural Sciences: Nanoscience and Nanotechnology
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
