Abstract
The effect of 1 MeV Au+ ion irradiations on the layer stability of the Fe3O4-based films grown epitaxially on MgO(001) substrates was investigated by Rutherford backscattering spectroscopy (RBS) and RBS-Channelling (RBS-C). The ion mixing effect leads to an appearance of the additional FeO x layer and a large enlargement of the thickness of the mixed (Fe,Mg,O) layer in the interfaces. Au+ ions were found to be implanted deeply in the MgO substrate. RBS-C experiments have confirmed that the heavy metallic ion irradiations induce a disorder in the crystalline lattice.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Advances in Natural Sciences: Nanoscience and Nanotechnology
Paper Title
Journal
Date
