Abstract

1,2‑Dihydroxyanthraquinone (Alizarin-AZ) is available, low-cost organic compound. Besides, AZ has multiple applications owing to its drawing attention photoactivity. This paper is devoted to study the influence of Gamma irradiation on the morphology, optical, and dielectric properties of AZ nanostructured thin films. Nanostructure powder of Alizarin is synthesized according to chemical routes. Subsequently, thin films of AZ are fabricated via thermal evaporator. The bared thin film is irradiated at different doses of 60Co γ-rays. Furthermore, the bared and irradiated films are characterized via X-ray diffraction (XRD), atomic force microscope (AFM) and UV-Vis-NIR spectroscopy. XRD investigations reveal that the bared film has a nanostructure and the average particle size increases gradually as the γ-irradiation dose increases. AFM images show remarkable increment in the surface roughness of the irradiated film over the bared one. In the light of structure induced changes, clear variations in the optical properties are addressed. Of these, the energy gap decreases gradually as the irradiation dose increases. The film irradiated at 45 kGy shows the highest optical conductivity. Based on our results we suggest AZ nanostructured thin films as potential candidate for optoelectronics devices.

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