Abstract
Exchange coupling between hard and soft magnetic materials has implications for both permanent magnet and magnetic recording technologies. This paper looks at exchange coupling of FCC FePt epitaxially grown onto (0 0 1) oriented L1 0 FePt deposited on (0 0 1) MgO substrates at elevated temperature. By varying the thickness of the FCC layer there is a relaxation of the single crystal FCC layer that produces a polycrystalline microstructure as evidenced by the development of rings in the electron diffraction pattern. A concurrent decoupling of the layers is apparent from magnetization curves with two distinct switching fields as the FCC layer thickness is increased above 20 nm. The results shown here confirm the importance of the epitaxial relationship between materials of disparate anisotropies in maintaining strong exchange coupling.
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