Квантование электромагнитного поля в трехмерных фотонных структурах на основе формализма матрицы рассеяния (S-квантование)

Abstract

AbstractA technique for quantization of the electromagnetic field in photonic nanostructures with three-dimensional modulation of the dielectric constant is developed on the basis of the scattering matrix formalism ( S quantization in the three-dimensional case). Quantization is based on equating the eigenvalues of the scattering matrix to unity, which is equivalent to equating each other the sets of Fourier expansions for the fields of the waves incident on the structure and propagating away from the structure. The spatial distribution of electromagnetic fields of the modes in a photonic nanostructure is calculated on the basis of the R and T matrices describing the reflection and transmission of the Fourier components by the structure. To calculate the reflection and transmission coefficients of individual real-space and Fourier-space components, the structure is divided into parallel layers within which the dielectric constant varies as a function of two-dimensional coordinates. Using the Fourier transform, Maxwell’s equations are written in the form of a matrix connecting the Fourier components of the electric field at the boundaries of neighboring layers. Based on the calculated reflection and transmission vectors for all polarizations and Fourier components, the scattering matrix for the entire structure is formed and quantization is carried out by equating the eigenvalues of the scattering matrix to unity. The developed method makes it possible to obtain the spatial profiles of eigenmodes without solving a system of nonlinear integro-differential equations and significantly reduces the computational resources required for calculating the probability of spontaneous emission in three-dimensional systems.