Abstract
The article considers the task of analyzing distributed data of temperature modes of chips of switching equipment of computer networks. For this, a temperature measurement system using a temperature sensor is used. In the case when the temperature sensor is inside the chip, the speed of the measurement system's response to temperature changes is satisfactory. However, when the sensor is outside the chip, due to the inertness of the thermal contact, the response speed of the measuring system is low. In this situation, the effectiveness of the control system becomes unsatisfactory. To overcome the inertness of temperature sensors, it is proposed to analyze the distributed data that is received in digital form on the data processing server by restoring the distorted signals of nonlinear measuring subsystems «chip – temperature sensor» based on the use of their mathematical models in the form of a partial sum of the Volterra integro-power series. The identification of the mathematical model of the measurement subsystem is carried out on a finite interval of time by conducting a series of experiments using test signals. The method of reducing the number of test signals based on taking into account the specificity of the impact of nonlinearity on the results of experiments is considered. The obtained model is the basis for solving the inverse problem of restoring the signal of temperature influence at the sensor input. Since this problem is incorrect, it is suggested to supplement the model with a regularization parameter and reduce the problem to a correct one. To use the model over an infinite period of time, a computer modeling technique is proposed using restarts of computing processes, which are carried out in several streams with a shift in time. The result of calculations is formed by combining fragments from different streams. To check the reliability of the results obtained by applying the developed method, the solutions of the model problems are given.
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More From: Mathematical and computer modelling. Series: Technical sciences
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