발사환경에 대한 전자광학탑재체의 구조건전성 검증

Abstract

In this study, a structural model was manufactured and a launch environment test was conducted to verify that the designed Electro-optical payload could withstand the launch environment. Two tests were conducted: random vibration test and shock test. In random vibration test, a notching was applied to prevent excessive dynamic loads on the structure by considering design load. Before and after conducting each test, a low-level sinusoidal sweep test was performed to confirm that there are no structural defects by examining the changes in the natural frequency and damping characteristics. Using this, the structural integrity of the Electro-optical payload for random vibration and shock tests could be verified. A limitation with the notching method, introduced in this paper, is that it is only applicable if the non-linearity of the structure can be ignored. However, there is a great advantage in terms of efficiency because this method can be applied without a prior structural analysis for notching.