디지털트윈을 이용한 LCD제품의 CTQ선정 및 Crosstalk 불량예측

Abstract

Purpose: This paper proposes a defect prediction method using digital twins that may overcome the defect detection limitations arising from model-based and data-driven approaches.BRMethods: To apply the digital twin concept to LCD products, we propose a procedure for the fabrication and validation of digital twins. The crosstalk defect, which is one of the major LCD defects, can be predicted using the developed digital twin. Virtual experimentation conducted based on that were carried out to identify and validate the control parameters.BRResults: Using the digital twin of LCD products, it was possible to review the process’ CTQ selection adequacy and control specifications. Additionally, by applying the CTQ data of the process to the digital twin, the occurrence of crosstalk defects became predictable.BRConclusion: It has been confirmed through case studies that the defect prediction method using digital twins can be effectively applied to the manufacturing industry. Further research on the diversification of defect prediction, digital twin production tools simplification, and real-time connection system of process CTQ data may be conducted.