Abstract
The article provides a brief overview of ways to optimize binary algorithms for identifying a failed element. For a continuous object specified by a functional circuit, a mathematical model has been synthesized in the form of a table of fault functions (TFN). Using the TFN, you can calculate the minimum diagnostic test and build a troubleshooting dictionary. On the basis of the fault dictionary, the sequence of checks has been determined, i.e. an optimized and effective algorithm for binary identification of a failed functional element for the object of diagnosis in the form of a graph has been built.
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