Abstract
This paper presents the measured waveform and its uncertainty using a nonlinear vector network analyzer (NVNA). For traceable measurement, calibration standards such as a coaxial calibration kit, comb generator, and power sensor are used, and the associated uncertainties are evaluated. We manufactured mTRL calibration standards on the PCB and evaluated its uncertainty using StatistiCAL. In particular, a comb generator and calibration kit were evaluated considering the correlation between frequencies. This evaluation enables the uncertainty of the inverse Fourier transformed waveform to have an increasing value at the transient in the time domain. The uncertainties of the power sensor and mTRL calibration standards assume that their correlations between frequencies are small. Finally, the effects of each uncertainty factor were compared and analyzed in the time domain.
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