Abstract
The effect of elastic deformations on the ferromagnetic resonance spectrum of submicron polycrystalline films of yttrium iron garnet obtained by ion-beam sputtering on silicon and gallium arsenide substrates was studied. Magnetoelastic constants of the films on both substrates were calculated using the magnitude of the frequency shift of the absorption maximum in the ferromagnetic resonance spectrum. The value of constants did not exceed 16% of the known values for bulk polycrystalline garnet. The approach to increase the efficiency of electrical frequency tuning in composite multiferroic structures based on combination of static and dynamic (caused by the piezoelectric effect) deformations was proposed.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
