Von Hamos Geometry Research Articles

A high-resolution asymmetric von Hamos spectrometer for low-energy X-ray spectroscopy at the CRYRING@ESR electron cooler

We present research program and project for high-resolution wavelength-dispersive spectrometer dedicated to low-energy X-ray spectroscopy at the electron cooler of the CRYRING@ESR storage ring, which is a part of the international Facility for Antiproton and Ion Research (FAIR) currently being built in Darmstadt. Due to the unique shape of the electorn-ion recombination X-ray source, resulting from the overlapping of the electron and ion beams in the electron cooler, the spectrometer can work in the specific asymmetric von Hamos (AvH) geometry. In order to completely eliminate the influence of Doppler effect on the measured X-ray energies, two asymmetric von Hamos spectrometers will be installed next to the dipole magnets on both sides of the electron cooler to detect blue/red (0°/180°) shifted X-rays, e.g. emitted in the radiative recombination (RR) process. The X-ray-tracing Monte-Carlo simulations show that the proposed AvH spectrometer will allow to determine with sub-meV precision, the low-energy X-rays (5–10 keV) emitted from stored bare or few-electron heavy ions interacting with cooling electrons. This experimental precision will enable accurate studies of the quantum electrodynamics (QED) effects in mid-Z H- and He-like ions.

Experimental capabilities for liquid jet samples at sub-MHz rates at the FXE Instrument at European XFEL.

The Femtosecond X-ray Experiments (FXE) instrument at the European X-ray Free-Electron Laser (EuXFEL) provides an optimized platform for investigations of ultrafast physical, chemical and biological processes. It operates in the energy range 4.7-20 keV accommodating flexible and versatile environments for a wide range of samples using diverse ultrafast X-ray spectroscopic, scattering and diffraction techniques. FXE is particularly suitable for experiments taking advantage of the sub-MHz repetition rates provided by the EuXFEL. In this paper a dedicated setup for studies on ultrafast biological and chemical dynamics in solution phase at sub-MHz rates at FXE is presented. Particular emphasis on the different liquid jet sample delivery options and their performance is given. Our portfolio of high-speed jets compatible with sub-MHz experiments includes cylindrical jets, gas dynamic virtual nozzles and flat jets. The capability to perform multi-color X-ray emission spectroscopy (XES) experiments is illustrated by a set of measurements using the dispersive X-ray spectrometer in von Hamos geometry. Static XES data collected using a multi-crystal scanning Johann-type spectrometer are also presented. A few examples of experimental results on ultrafast time-resolved X-ray emission spectroscopy and wide-angle X-ray scattering at sub-MHz pulse repetition rates are given.

X-ray spectroscopy station for sample characterization at ELI Beamlines

X-ray spectroscopy is a demanded tool across multiple user communities. Here we report on a new station for X-ray emission spectroscopy at the Extreme Light Infrastructure Beamlines Facility. The instrument utilizes the von Hamos geometry and works with a number of different sample types, notably including liquid systems. We demonstrate a simple and reliable method for source position control using two cameras. This approach addresses energy calibration dependence on sample position, which is a characteristic source of measurement uncertainty for wavelength dispersive spectrometers in XES arrangement. We also present a straightforward procedure for energy calibration of liquid and powder samples to a thin film reference. The developed instrumentation enabled us to perform the first experimental determination of the Kα lines of liquidized K3Fe(CN)6 as well as powdered and liquidized FeNH4(SO4)2. Finally, we report on proof-of-principle use of a colliding jet liquid sample delivery system in an XES experiment.

Experimental determination of the gadolinium L subshells fluorescence yields and Coster‐Kronig transition probabilities

AbstractThe L subshell Coster‐Kronig (CK) transition factors of Gd have been experimentally determined by means of two different experimental approaches and compared to available literature data. On the one hand, reference‐free X‐ray fluorescence (XRF) analysis using an energy‐dispersive detector was applied. This method permitted in addition to determine the L subshell fluorescence yields since the absolute incident and emitted X‐ray photon flux can be determined. On the other hand, a wavelength‐dispersive spectrometer based on a modified von Hamos geometry using a full cylinder highly annealed pyrolithic graphite crystal was used for an experimental validation of the CK transition factors in an independent experiment. The use of this high energy resolution spectrometer allowed thanks to the capability to better discriminate the different X‐ray emission lines to validate the reference‐free XRF results. For both experiments, the use of calibrated instrumentation enabled the provision of a reliable uncertainty budget on the results obtained.

A double crystal von Hamos spectrometer for traceable x-ray emission spectroscopy.

A novel double full-cylinder crystal x-ray spectrometer for x-ray emission spectroscopy (XES) has been realized based on a modified von Hamos geometry. The spectrometer is characterized by its compact dimensions, its versatility with respect to the number of crystals used in series in the detection path, and the option to perform calibrated XES measurements. The full-cylinder crystals used are based on highly annealed pyrolytic graphite with a thickness of 40μm, which was bent to a radius of curvature of 50mm. The flexible designof the spectrometer allows for an easy change-within the same setup-between measurements with one crystal for maximized efficiency or two crystals for increased spectral resolving power. The spectrometer realized can be used at different end-stations of synchrotron radiation beamlines or can be laboratory-based. The main application focus of the spectrometer is the determination of x-ray fundamental atomic parameters in the photon energy range from 2.4 to 18keV. The evaluation of chemical speciation is also an area of application, as demonstrated in the example of battery electrodes using resonant inelastic x-ray scattering.

High resolution x-ray emission spectrometer for multiple hard x-ray emission lines: Demonstration for Cu Kα and Kβ emissions.

We present a compact 3D printed x-ray emission spectrometer based on the von Hamos geometry that represents a significant upgrade to the existing von Hamos geometry-based miniature x-ray emission spectrometer (miniXES) [Mattern et al., Rev. Sci. Instrum. 83(2), 023901 (2012)]. The upgrades include the incorporation of a higher pixel density 500K detector for improved energy resolution and an enlarged sample area to accommodate a wider range of sample formats. The versatile spectrometer houses removable crystal holders that can be easily exchanged, as well as movable alignment eyelets that give flexibility in Bragg angle selection. Designed for ease of manufacture, all the components, except for the apertures, can be 3D printed and readily assembled. We describe its implementation in measurements of resonant and non-resonant Cu Kα and Kβ x-ray emission and report the theoretical and measured energy resolution and collected solid angle of the emission.

A highly oriented pyrolytic graphite crystal spectrometer in von Hamos geometry for x-ray fluorescence experiments

A high-resolution x-ray spectrometer has been designed and constructed, using a highly oriented pyrolytic graphite Bragg crystal in von Hamos geometry. The spectrometer was designed to study x-ray fluorescence emissions of Ti, and it covers a detecting energy range from 4000 eV to 5500 eV. The factors affecting the spectral resolution and efficiency of the spectrometer were discussed. In particular, the bending of the spectral lines on the image plate was also corrected, due to the detecting plane not being parallel to the axis of the cylindrically curved crystal. Its performance has been evaluated in a laser–foil interaction experiment. The experimental results indicate that the spectrometer is of good spectral resolution and relatively high efficiency, which enables it as a suitable device for the measurements of high-resolution x-ray fluorescence spectroscopy.

200-mm segmented cylindrical figured crystal for von Hamos x-ray spectrometer.

A von Hamos Bragg crystal spectrometer at 1C beamline of Pohang Accelerator Laboratory for x-ray emission spectroscopy (XES) is described. Diced Si crystals of different orientations ([111], [110], [100], and [311]) are glued onto a planoconcave glass substrate having 250/500 mm radius of curvature. To enhance the spectrometer efficiency, the length of the crystal analyzer is kept 200 mm. The emission spectra of Cu foil and Fe foil and elastic scattering from Al foil are measured using the von Hamos geometry in which curved crystals disperse the x-rays. Spectrometer efficiency and energy resolution are measured at various x-ray photon energies. X-rays are incident at 6.54 keV, 9.00 keV, 9.205 keV, and 11.51 keV for Si(440), Si(444), Si(800), and Si(933) crystal analyzers, respectively. The cylindrical figured analyzer is placed near 80° with respect to the sample, which gives better energy resolution. The spectrometer efficiency of the Si(444) crystal analyzer increases by ∼2 times when the length of the analyzer is increased from 100 mm to 200 mm. Furthermore, to measure Fe Kα1, Kα2, and Kβ simultaneously, we made a mixed crystal analyzer in which alternative strips of Si[111] and Si[110] are glued onto one preshaped cylindrical substrate. The enhanced efficiency and simultaneous measurement of Kα and Kβ emission lines will give an edge over in situ and time-resolved x-ray emission spectroscopy studies. The information extracted with a high efficiency spectrometer from low intensity XES emission lines will be useful for the in situ elemental characterization in catalytic reactions.

A wavelength‐dispersive X‐ray spectrometer for in/ex situ resonant inelastic X‐ray scattering studies

A wavelength‐dispersive X‐ray spectrometer based on von Hamos geometry for in/ex situ resonant inelastic X‐ray scattering (RIXS) studies at BL14W1‐X‐ray absorption fine structure (XAFS) beamline of Shanghai Synchrotron Radiation Facility (SSRF) is reported. The design considerations and the operational characteristics of the spectrometer are described in detail. With a Si(444) bent crystal, the spectrometer provides an energy range from 8 to 9 keV, which enables the measurement of K‐edge X‐ray spectroscopy of some transition metal complexes and L‐edge X‐ray spectroscopy of some 5d transition metal complexes. Based on von Hamos geometry, the process of the collection of RIXS is considerably simplified. The collection of full RIXS planes of tungstic samples requiring spectral resolutions is presented, demonstrating the speciation capabilities of the instrument. Taking the series of oxide‐derived copper catalysts for carbon dioxide electrochemical reduction as the research model, the in situ RIXS were measured to probe dynamic changes in electronic structure. Finally, the comparison between in situ RIXS and in situ conventional XAFS is presented, demonstrating more competitive spectral resolution of RIXS.

Hard X-ray von Hamos Spectrometer for Single-Pulse Emission Spectroscopy

We developed a hard X-ray spectrometer for the purpose of measuring X-ray emission spectrum excited by using single X-ray free electron laser (XFEL) pulses. A highly oriented pyrolytic graphite (HOPG) crystal was placed in the von Hamos geometry to focus X-rays of the equal energy on a specific point in detector plane. The spectrometer was tested at PAL-XFEL using Ni and NiO films. The Ni $${K_{{\beta _{13}}}}$$ X-ray emission line excited by using a single X-ray pulse was successfully resolved. If the much weaker Ni $${K_{{\beta _{25}}}}$$ line is to be observed, data must be accumulated with a few thousands of X-ray pulses. The spectrometer energy resolving power, E/ΔE, was estimated to be 7500. This spectrometer can be utilized to conduct various X-ray emission and absorption measurements using XFELs.

A high-throughput energy-dispersive tender X-ray spectrometer for shot-to-shot sulfur measurements.

An X-ray emission spectrometer that can detect the sulfur Kα emission lines with large throughput and a high energy resolution is presented. The instrument is based on a large d-spacing perfect Bragg analyzer that diffracts the sulfur Kα emission at close to backscattering angles. This facilitates the application of efficient concepts routinely employed in hard X-ray spectrometers towards the tender X-ray regime. The instrument described in this work is based on an energy-dispersive von Hamos geometry that is well suited for photon-in photon-out spectroscopy at X-ray free-electron laser and synchrotron sources. Comparison of its performance with previously used instrumentation is presented through measurements using sulfur-containing species performed at the LCLS. It is shown that the overall signal intensity is increased by a factor of ∼15. Implementation of this approach in the design of a tender X-ray spectroscopy endstation for LCLS-II is also discussed.

A von Hamos spectrometer for in situ sulfur speciation by non-resonant sulfur Kα emission spectroscopy

A von Hamos geometry based wavelength dispersive spectrometer combined with an in situ reactor cell has been developed to measure non-resonant sulfur Kα emission for the in situ speciation of low concentrations of sulfur.

A compact and versatile tender X-ray single-shot spectrometer for online XFEL diagnostics.

One of the remaining challenges for accurate photon diagnostics at X-ray free-electron lasers (FELs) is the shot-to-shot, non-destructive, high-resolution characterization of the FEL pulse spectrum at photon energies between 2 keV and 4 keV, the so-called tender X-ray range. Here, a spectrometer setup is reported, based on the von Hamos geometry and using elastic scattering as a fingerprint of the FEL-generated spectrum. It is capable of pulse-to-pulse measurement of the spectrum with an energy resolution (ΔE/E) of 10-4, within a bandwidth of 2%. The Tender X-ray Single-Shot Spectrometer (TXS) will grant to experimental scientists the freedom to measure the spectrum in a single-shot measurement, keeping the transmitted beam undisturbed. It will enable single-shot reconstructions for easier and faster data analysis.

A Dispersive Inelastic X-ray Scattering Spectrometer for Use at X-ray Free Electron Lasers

We report on the application of a short working distance von Hamos geometry spectrometer to measure the inelastic X-ray scattering (IXS) signals from solids and liquids. In contrast to typical IXS instruments where the spectrometer geometry is fixed and the incoming beam energy is scanned, the von Hamos geometry allows measurements to be made using a fixed optical arrangement with no moving parts. Thanks to the shot-to-shot capability of the spectrometer setup, we anticipate its application for the IXS technique at X-ray free electron lasers (XFELs). We discuss the capability of the spectrometer setup for IXS studies in terms of efficiency and required total incident photon flux for a given signal-to-noise ratio. The ultimate energy resolution of the spectrometer, which is a key parameter for IXS studies, was measured to the level of 150 meV at short crystal radius thanks to the application of segmented crystals for X-ray diffraction. The short working distance is a key parameter for spectrometer efficiency that is necessary to measure weak IXS signals.

Calibration and characterization of a highly efficient spectrometer in von Hamos geometry for 7-10 keV x-rays.

We have built an absolutely calibrated, highly efficient, Bragg crystal spectrometer in von Hamos geometry. This zinc von Hamos spectrometer uses a crystal made from highly oriented pyrolytic graphite that is cylindrically bent along the non-dispersive axis. It is tuned to measure x-ray spectra in the 7-10 keV range and has been designed to be used on a Ten Inch Manipulator for the Omega and OmegaEP target chambers at the Laboratory for Laser Energetics in Rochester, USA. Significant shielding strategies and fluorescence mitigation have been implemented in addition to an imaging plate detector making it well suited for experiments in high-intensity environments. Here we present the design and absolute calibration as well as mosaicity and integrated reflectivity measurements.

Development of a WDX-μ-PIXE system for chemical state mapping

In this paper, we have developed a wavelength dispersive X-ray spectrometer microparticle-induced X-ray emission (WDX-[Formula: see text]-PIXE) system combining a microbeam system with high spatial resolution and wavelength dispersive X-ray (WDX) spectrometry with high-energy resolution for chemical state mapping. A Von Hamos geometry was used for the WDX system to achieve higher detection efficiency and energy resolution. The system consists of a curved crystal and a CCD camera. The WDX system was installed in a newly developed microbeam system. The energy resolution of the WDX system was 0.67 eV for [Formula: see text] (1740 eV). [Formula: see text] and [Formula: see text] X-ray spectra from various Si compounds were measured and chemical shifts related to chemical states were clearly observed. The system was applied to the chemical state analysis of clay particles. After elemental mapping of the clay particles using a conventional [Formula: see text]-PIXE system with a Si(Li) detector, particles to be analyzed were selected and analyzed sequentially with the WDX system. [Formula: see text] spectra from clay particles were obtained. The microscopic spatial distribution of elements and chemical state of the clay particles were sequentially measured with high energy and spatial resolution using a microbeam.

In situ hard X-ray quick RIXS to probe dynamic changes in the electronic structure of functional materials

Hard X-ray RIXS permits monitoring the electronic state of materials under in situ conditions. Time resolved, or quick RIXS, allows following dynamic changes in the electronic structure, which enables the identification of short-lived reaction intermediates. Within, we report the development of in situ quick RIXS spectroscopy, using a wavelength dispersive spectrometer operated in the von Hamos geometry. The main operational characteristics and performance of this experimental setup are presented. Dynamic changes in electronic structure are reported for the first time with quick RIXS, demonstrated on the reduction of Au2O3. The quick RIXS methodology can be implemented at any spectroscopy hard X-ray beamline. Therefore we envisage this tool to be widely used in the study of materials dynamic electronic changes.

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.

A multi-crystal wavelength dispersive x-ray spectrometer

A multi-crystal wavelength dispersive hard x-ray spectrometer with high-energy resolution and large solid angle collection is described. The instrument is specifically designed for time-resolved applications of x-ray emission spectroscopy (XES) and x-ray Raman scattering (XRS) at X-ray Free Electron Lasers (XFEL) and synchrotron radiation facilities. It also simplifies resonant inelastic x-ray scattering (RIXS) studies of the whole 2d RIXS plane. The spectrometer is based on the Von Hamos geometry. This dispersive setup enables an XES or XRS spectrum to be measured in a single-shot mode, overcoming the scanning needs of the Rowland circle spectrometers. In conjunction with the XFEL temporal profile and high-flux, it is a powerful tool for studying the dynamics of time-dependent systems. Photo-induced processes and fast catalytic reaction kinetics, ranging from femtoseconds to milliseconds, will be resolvable in a wide array of systems circumventing radiation damage.

A plastic miniature x-ray emission spectrometer based on the cylindrical von Hamos geometry

We present a short working distance miniature x-ray emission spectrometer (miniXES) based on the cylindrical von Hamos geometry. We describe the general design principles for the spectrometer and detail a specific implementation that covers Kβ and valence level emission from Fe. Large spatial and angular access to the sample region provides compatibility with environmental chambers, microprobe, and pump/probe measurements. The primary spectrometer structure and optic is plastic, printed using a 3-dimensional rapid-prototype machine. The spectrometer is inexpensive to construct and is portable; it can be quickly set up at any focused beamline with a tunable narrow bandwidth monochromator. The sample clearance is over 27 mm, providing compatibility with a variety of environment chambers. An overview is also given of the calibration and data processing procedures, which are implemented by a multiplatform user-friendly software package. Finally, representative measurements are presented. Background levels are below the level of the Kβ(2, 5) valence emission, the weakest diagram line in the system, and photometric analysis of count rates finds that the instrument is performing at the theoretical limit.