In stressed operating conditions, several types of voltage stability indices (VSI) are used for the assessment of voltage stability at specific operating points. The performance of various available VSIs are compared in this paper. The one generation unit tripped effects, single line to ground (SLG) fault and inductive loading variations occur in combinational format with such operating conditions. Voltage collapse occurs in the lines or nodes due to the stressed operating conditions (SOC). SLG fault, loading effects, power margin, line continency ranking, and line number are some of the performance parameters of VSI analysed in this paper. For utilization of reactive power compensation, the proper location can be chosen with the help of critical line and node analysis (CLNA) that makes use of VSIs. For any SOC, accurate voltage instability prediction is performed using VSI as per the simulation results. Under voltage collapse due to multiple causes, the voltage stability assessment of any specific line can be performed using this information.