A weighting algorithm for application in the Thru-Reflect-Line (TRL) calibration technique is presented to enhance the accuracy and reliability of vector network analyzer (VNA) measurements over broad frequency bands. The method addresses the inherent limitations of the traditional TRL calibration, particularly the step changes observed in banded-TRL approaches when multiple Line standards are used. By introducing a bespoke weighting function that assigns phase-dependent weights to each Line standard, smoother transitions and improved S-parameter measurements can be achieved. Experimental validation using measurements of both 3.5 mm and Type-N devices demonstrates the effectiveness of the weighted-TRL method in eliminating discontinuities and calibration artifacts across a wide range of frequencies. The results reveal the improved calibration of S-parameters this approach can yield compared to traditional TRL calibration methods. The developed weighted-TRL calibration technique offers a significant advancement in metrology-grade measurements, enabling more precise characterization of high-frequency devices across broad frequency bands. By mitigating a key limitation of the TRL calibration, this method provides a valuable tool for enhancing the accuracy and reliability of VNA measurements for precision metrology applications.
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