Use Of Scanning Probe Microscope Research Articles

АСМ-АНАЛИЗ ПОВЕРХНОСТИ ПРОФИЛИРОВАННОЙ СУЛЬФОКАТИОНООБМЕННОЙ МЕМБРАНЫ ПОСЛЕ КОНТАКТА С ФЕНИЛАЛАНИНОМ

Методом атомно-силовой микроскопии исследована неоднородность поверхности профилированной сульфокатионообменной мембраны после химического кондиционирования и контакта с водными растворами фенилаланина. Определены микропрофили, гистограммы плотности распределения значений высот и cтaндaртные aмплитудные пaрaметры шерoхoвaтocти поверхности oбрaзцoв мембрaны МК-40пр. Установленные различия в структуре, вoзрacтaние oднoрoднocти пoверхнocти мембрaны пocле кoнтaктa c аминокислотой связано с уменьшением количества и размеров макропор и крупных дефектов поверхности вследствие сорбции аминокислоты.
 
 Работа выполнена при финансовой поддержке РФФИ (проект № 18-08-01260).
 АСМ-изображения поверхности мембраны были получены на оборудовании Центра коллективного пользования Воронежского государственного университета. URL: http://ckp.vsu.ru.

走査型プローブ顕微鏡による微細加工—局所的アノード酸化と還元反応

Oxidation locally induced on a material surface by the use of scanning probe microscope (SPM)-based techniques is applicable to nanofabrication of a wide variety of materials including metals, semiconductors, inorganic compounds and organic materials. The mechanism of the SPM-induced local oxidation in the presence of the adsorbed water column formed at the SPM tip/sample junction is ascribed to electrochemical oxidation, that is, anodization, proceeding in the water nano-column, when the bias polarity is positive for the sample substrate. As well as scanning probe anodization of Si and Ti, a scanning probe lithography process in which an alkyl self-assembled monolayer (SAM) as a resist film patternable by anodization is described in this review. The patterned SAM was successfully applied to an etch mask in order to fabricate nano-grooves on Si. Besides oxidation, an example of nano-patterning based on electrochemical reduction is also demonstrated.

Self-aligned nucleation of gold onto templates with a nano-scale precision fabricated by scanning probe lithography

Nanostructures consisting of concentric Au circles with a nm-scale line thickness have been fabricated on silicon (Si) substrates based on electroless plating and by the use of scanning probe microscope as a lithographic tool. First, a micro-template was fabricated on a hexadecyl self-assembled monolayer (HD-SAM) covalently bonded to a Si(1 1 1) substrate by scanning probe anodization lithography in which the HD-SAM was locally degraded and the substrate Si was anodized along a trace of an conductive AFM-tip biased negatively to the grounded Si substrate. Anodic Si oxide formed by this local anodization process was then etched with HF in order to expose the Si surface under the anodic oxide layer. Consequently, a Si nanopattern surrounded with the HD-SAM identical to the anodic oxide pattern was formed. This Si nanopattern served as a template for fabricating a Au nanostructure by means of electroless plating. Due to the galvanic displacement of surface Si atoms with Au complex ions in a plating bath, Au started to nucleate on the exposed Si surface, while no nuclei was formed on the surrounding HD-SAM. Consequently, a Au nanostructure was formed through further Au deposition on the Au nuclei. The fabricated Au nanostructures are promising for applications emerging plasmonic functions.

The use of scanning probe microscope with a diamond tip as a nanotechnological tool

Experimental results of the use of a scanning probe microscope having a nanometric resolution in surface machining have been considered. Specific features of the device are a tip of boron-doped diamond single crystal and electromagnetic system of measuring a nanointeraction between the tip and sample surface. Three-dimensional images of gold and silicon surfaces after nanocleaning and nanoscratching have been demonstrated. The possibilities to use diamond nanotools for making elements of nanoelectronics have been discussed.

Research on three dimensional machining effects using atomic force microscope

This research studies the use of scanning probe microscope as the tool to manufacture three dimensional nanoscale objects. We modified a commercial atomic force microscope (AFM) and replaced the original probe control system with a personal computer (PC) based controller. The modified system used the scanning probe in the AFM for the cutting tool and used the PC controller to control work piece. With the new controller, one could implement multiaxes motion control to perform trajectory planning and to test various cutting strategies. The experiments discovered that the debris can coalesce with the sample material and cause tremendous problem in the nanomachining process. This research thus proposed to make use of this material and developed a piling algorithm to not only cut but also pile up the debris in a favorable way for steric shaping. The experimental results showed that the proposed cutting and shaping algorithm can produce nano-objects as high as a few hundred nanometers. The probe tip typically wears down to around 500 microm diameter after the machining process, putting a limit on the machining resolution. The vertical resolution can achieve less than 10 nm without controlled environment.

Nanoindentation of polymers: an overview

In this paper, the application of instrumented indentation devices to the measurement of the elastic modulus of polymeric materials is reviewed. This review includes a summary of traditional analyses of load-penetration data and a discussion of associated uncertainties. Also, the use of scanning probe microscopes to measure the nanoscale mechanical response of polymers is discussed, particularly with regard to the associated limitations. The application of these methods to polymers often leads to measurements of elastic modulus that are somewhat high relative to bulk measurements with potentially artificial trends in modulus as a function of penetration depth. Also, power law fits to indentation unloading curves are often a poor representation of the actual data, and the power law exponents tend to fall outside the theoretical range. These problems are likely caused by viscoelasticity, the effects of which have only been studied recently. Advancement of nanoindentation testing toward quantitative characterization of polymer properties will require materialindependent calibration procedures, polymer reference materials, advances in instrumentation, and new testing and analysis procedures that account for viscoelastic and viscoplastic polymer behavior.

Nanoscale reliability assessment of electronic devices

As a result of the continuous reduction of feature sizes in electronic devices, reliability issues have to be treated with an accordingly high spatial resolution inducing the need for nanoscale measuring techniques. The use of scanning probe microscope based methods allows to determine thermal, mechanical, electrical, electronic, optical and optoelectronic properties as well as the localization of failures and the access to device internal waveforms. As all methods are based on standard scanning force microscopes, an introduction into this technique in general is followed by a description of important specialized methods. Applications of these techniques cover a wide range of semiconducting devices from silicon integrated devices (ULSI), III-V-compound devices for very high frequencies, optoelectronic components and power devices.

Characterization of Laser-Annealed Magnetic Garnet Films by Scanning Probe Microscopy

Surface damage and magnetic structures in laser-annealed magnetic garnet films investigated by the use of scanning probe microscopes, were i.e., Atomic Force Microscope (AFM), Magnetic Force Microscope (MFM), and Near-field Scanning Optical Microscope (NSOM). AFM images showed the atomically flat surface of the laser-annealed region in which the growth-induced magnetic anisotropy was strongly reduced. MFM and NSOM images showed sharp changes in the direction of magnetization at the boundary between the laser-annealed region and laser-annealed region. These results show that the laser-annealing technique is very useful for fabricating waveguide optical isolators.

Probe microscopies: feeling their way

The invention of the scanning tunnelling microscope (STM) in the early 1980s revolutionized the field of microscopy. The STM is the first of a growing family of probe microscopes which image surfaces by scanning them with a sharp probe, measuring some form of interaction between the probe and the surface. The invention of the STM was closely followed by the development of the scanning force microscope (SFM). Since their inception, scanning probe microscopes have had an obvious appeal to biologists and biophysicists. Both techniques are capable, under appropriate conditions, of obtaining atomic resolution images of suitable surfaces. Images can be obtained under gaseous or liquid environments, offering the prospect for studying biological systems under ‘native’ or ‘physiological’ conditions. Because of its detection mechanism the STM is largely restricted to the study of interfaces or individual biopolymers and their interactions. However, the potential magnification range achievable with the SFM spans the ranges covered by both light and electron microscopes. Examples of the use of scanning probe microscopes will be given in areas relevant to food and agriculture, and potential applications of the microscopes will be discussed.