The design of a general-purpose (wide range and independent of the properties of a specific material) radioisotopic instrument capable of high-accuracy measurement of a certain physical parameter would make it possible to dispense with the expensive practice of designing local narrow-range meters. Unfortunately, until recently the design of such an instrument was impossible. This situation has now changed mainly because of the availability of program-controlled facilities (single-board, mini-, and personal computers) for processing measuring, control, and providing auxiliary information; advances in the production of radionuclides with specified properties (mass, size, radiation intensity and energy, etc.); and the design of x-ray tubes with controlled high-voltage sources, development of metrological support especially in the field of equivalent standards and procedures for automatic plotting of transition functions and calibration curves (CCs). The use of program-controlled facilities in RMIs provided a way to overcome many problems associated with increase the accuracy and quality of instruments that were impossible to solve by hardware only because of the required increase of weight, size, power consumption, and associated deterioration of other RIP characteristics. Among others, these problems include the use of complex functions for smoothing experimental data for plotting CCs and transition functions (in laboratory investigations and in operation), more accurate correction of RMI readings depending on the combined effect of influencing factors, varying the measurement time as a function of count rate for a given RMI error level, determination of the effect of the most influencing impurity on the results of measurement of a given parameter with the aid of a spectrometric detector, programmed control of scanners and other auxiliary devices during measurement, determination of scanner accuracy over the entire scanning range, etc. Application of equivalent standards (ESs) in plotting calibration curves and transition functions [i] makes it possible to design an instrument for measuring a certain physical parameter in any specific material in which the measured parameter lies within the instrument range. Equivalent standards are fabricated from inexpensive and readily available materials (e.g., aluminum, dacron, etc., can be used to calibrate thickness meters for flat materials) that possess long-term stability, are not affected by changes of atmospheric parameters (temperature, humidity, pressure), and are resistant to common reagents. Equivalent standards also are used as a reference for correction of instrument readings during measurements. Equivalent standards are useful for the following reasons:
Read full abstract