Photovoltaic (PV) technology has emerged as a promising and significant renewable energy source in recent decades. However, the assessment of the on-site power generation performance of a PV system is often hindered by inline faults. Additionally, the degradation of the PV module's performance over time indirectly affects the operation of the power conditioner, leading to a decrease in the overall conversion efficiency of the power supply. Therefore, the accurate and efficient inspection of faults and aging status in series-connected PV modules is essential for ensuring reliable operation. This study proposes an improved Time Domain Reflectometry (TDR) technology as a standard inspection method. The TDR technology is initially employed to detect both open and shorted-circuits in series-connected PV panels with the suggested breakpoint simulation. Furthermore, the proposed TDR impedance log method enhanced the evaluation of the PV modules at different aging degrees using various monocrystalline silicon modules for practical verification. The study provides TDR as a comprehensive and effective technique for simultaneously identifying faults and inspecting the aging of PV systems.
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