The lithology and rock physical properties of tight sandstone reservoirs become increasingly complex, resulting in a more challenging reservoir evaluation process. Conventional rock physics experiments are too restrictive to adequately investigate formation properties. The emerging digital rock physics (DRP) technology in recent years effectively overcomes these constraints. Nevertheless, the current DRP faces two major challenges: the integration of multiple-resolution images and the upscaling of rock physics properties (electricity). In this paper, we propose an innovative method for assigning electrical characteristics to voxel units, enabling the integration of multi-resolution images, as well as a novel approach for establishing a new saturation model to achieve electrical property upscaling. Initially, core samples are selected and drilled based on logging data and lithology analysis, followed by multi-resolution scanning experiments, including X-ray CT, QEMSCAN, and MAPS. After that, mineral components are segmented, and multi-component digital rocks are constructed. Considering mineral voxel as the analytical units, pore characteristics within each mineral, which are extracted from MAPS, are used to generate 3-D pores by QSGS method. These generated 3-D pores are then merged with their respective mineral voxel. Subsequently, the electrical properties of the merged models are simulated and assigned to multi-component digital rock. This process enables the integration of multi-resolution images, leading to the construction of high-precision digital rocks. Additionally, high-precision digital rock-based electrical modeling is conducted, and a new saturation model is then established by combining digital rock physics, experiment rock physics, and theoretical rock physics. Finally, the new saturation model is applied to calculate saturation, accomplishing electrical property upscaling. Application results show the new saturation model improves the accuracy of saturation evaluation, demonstrating the feasibility of the upscaling method for electrical properties.
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