The three-level dual-active-bridge (TL-DAB) DC-DC converter is a promising dc-dc converter for high-voltage and high-power systems. Open-circuit faults on power switches are crucial issues for the TL-DAB dc-dc converters, resulting in various performance degradations such as dc bias and divided capacitor voltage imbalance. The mode analysis after fault is necessary for fault detection and fault-tolerant control. Subsequently, fault-tolerant control is essential to reduce or overcome these issues. In the proposed fault-tolerant method, when the primary side inner switch or the secondary side switch breaks down, the gate-driving signal of the complementary switch is recommended to block and the effects can be removed. Finally, experiment results demonstrate that the issues caused by open-circuit faults can be reduced significantly with the proposed fault-tolerant method.