In an inertial confinement fusion (ICF) ultrafast diagnostic system that is based on electron beam time-dilation, an ultrafast electrical pulse is used to excite a microstrip photocathode (PC), which generates a varying PC voltage to obtain a photoelectron velocity that varies with emission time. The photoelectron beam achieves time-dilation through the drift process and is then detected by a time-resolved sensor, thereby increasing the temporal resolution of the diagnostic system. A pulse time-dilation diagnostic system is simulated, while the sensor is a gated microchannel plate (MCP) detector with a temporal resolution of 100 ps and an excitation pulse on a PC with a slope of 3 V/ps; the diagnostic system achieves a temporal resolution of 11.12 ps. However, the excitation pulse creates a voltage difference across the PC. A voltage difference of 900 V can be acquired for a PC length of 60 mm, which yields a nonuniform spatial resolution ranging from 30.4 µm to approximately 3000 µm. Furthermore, the voltage difference across the PC also limits the frame size to 2.2 mm along the pulse propagation direction according to the simulation results. To achieve a uniform spatial resolution and a larger frame size, a dual-pulse excitation technique on a PC is presented, which is the technique to symmetrically apply voltage pulses at both ends of the PC microstrip. The theoretical results show that this technique will improve the uniformity of the PC voltage spatial distribution. When the PC pulse slope is 3 V/ps and the dual-pulse excitation technique is employed, the diagnostic system has a temporal resolution of 5.91 ps and a uniform spatial resolution of 30.4 µm. Furthermore, the frame size along the pulse propagation direction is improved to the effective length of the microstrip PC.