Strain Distribution Of Materials Research Articles

Effect of epoxy impregnation on strain distribution of materials in Bi2223 superconducting coils by using synchrotron X-ray diffraction

Synchrotron X-rays have been used to observe strain distributions in composite materials such as superconducting wires with a thickness of less than about 2 mm. In applications that employ wound coils of superconducting wire, it is necessary to understand the strain distribution within the coiled wire. Superconducting wires such as Bi2223 and REBCO wires approximately 4–5 mm wide are commercially available. Coiled wires of this width are too thick to easily measure using conventional X-ray techniques, especially the inner strain, because the penetration depth tends to be around 2 mm. Therefore, the beam penetration must be improved, and it is known that the penetration depth of an X-ray beam depends upon the beam energy, beam intensity, measurement material, and measurement method. In this study, we used a white X-ray diffractometer at SPring-8 to develop a method of observing the strain distribution in Bi2223 superconducting coils winded by a 4.5 mm wide Bi2223 wire. We successfully observed a clear (400) peak of the Bi2223 phase by an appropriate measurement condition, and then observed the strains of each material in the Bi2223 coils with and without epoxy impregnation. This is the first time that we have obtained the strain of a Bi2223 phase in coiled wire using synchrotron X-ray diffraction. Further synchrotron-based study of superconducting coils will be useful in the development of advanced high-field magnets. The appropriate measurement method and the obtained measurement results are presented in this paper.

Image of the Optical Grating Modulated by the Signal and Its Application to the Measurement of Strain Distribution

A treatment is given for obtaining the image from a modulated object in a projection system. A diffraction grating put on the object plane converts the entering plane wavefront from a light source into a periodic wavefront, which gives a carrier wave, and the signal to be projected is given on the carrier as an amplitude, phase, or frequency modulation. The modulated carrier wave forms its spectrum on the entrance pupil of the projection lens. The signal appears as side bands of each carrier spectrum. A narrow opaque mask put on the plane of the spectra acts as a detector, which cuts off some spectral components, and the residual spectra reveal the image of the signal on a screen. A mask whose transmittance varies as a function of position, that is, a frequency selective filter, is used to detect the signal from a frequency-modulated carrier. The method is shown to be useful to analyze the image from an object pattern composed of scanning lines or mesh points, to detect the defects of optical gratings, and to measure the strain distribution of materials under test.