Spinetoram is a novel insecticide that belongs to the spinosyn class of insecticidal chemicals. The efficacy of spinetoram against numerous insect pest species in a variety of field crops has been well demonstrated. However, there are no data available for the effectiveness of spinetoram against stored grain insects. In the present study, we evaluated spinetoram as a grain protectant, against six stored-product Coleoptera. The species tested were: the rice weevil, Sitophilus oryzae, the lesser grain borer, Rhyzopertha dominica, the larger grain borer, Prostephanus truncatus, the confused flour beetle, Tribolium confusum, the granary weevil, Sitophilus granarius and the sawtoothed grain beetle, Oryzaephilus surinamensis. All species were tested at the adult stage, on wheat (or maize in the case of P. truncatus) treated to achieve spinetoram concentrations of 0.01, 0.1, 0.5, 1, 2, 5 and 10 ppm. Mortality was recorded after 1, 2, 7, 14 and 21 d of exposure, and 65 d later the wheat and maize were examined for offspring emergence. Among the species examined, P. truncatus and R. dominica were by far the most susceptible, given that mortality was close to 100% after 7 d on wheat treated or maize with 0.1 ppm of spinetoram. At this concentration, progeny production of P. truncatus and R. dominica was negligible. On the other hand, T. confusum was the least susceptible; mortality reached 95% only at 10 ppm, and only after 14 d of exposure. Similarly, O. surinamensis was of limited susceptibility to spinetoram; mortality reached 95% only after 14 d of exposure on wheat treated with 5 ppm. Nevertheless, offspring emergence of these species was extremely low. For S. granarius and S. oryzae, complete (100%) mortality was recorded after 14 d of exposure, at 0.5 and 1 ppm, respectively. At these concentrations or higher, progeny production was notably reduced. The results of the present study demonstrate that spinetoram is effective as a grain protectant, but its efficacy varies according to the target species, concentration and exposure interval.
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