Standard X-ray Diffraction Powder Patterns Research Articles

Standard X-Ray Diffraction Powder Patterns of Fifteen Ceramic Phases

Fifteen reference patterns of oxide ceramics are reported. Included in the fifteen reference patterns are data for nine high critical temperature superconducting oxide and related phases Ba2Cu3ErO7, Ba3.2Cu1.7Er0.8O6.1·xCO2, Ba2Cu3HoO7, Ba2Cu3(Pr0.5Y0.5)O7, Ba3Dy4O9, Ba3Yb4O9, (Ba0.6Sr0.4)2Cu3YO7, (Ba0.8Sr0.2)2Cu3YO7, and CuNd2O4. The general methods of producing diese X-ray powder diffraction reference patterns were described previously in this journal (Vol. 1, No. 1, pg. 40 (1986)). The symbols used in diis article are defined in the PDF cards.

Standard X-Ray Diffraction Powder Patterns of Fourteen Ceramic Phases

Fourteen reference patterns of oxide ceramics are reported. Included in the fourteen reference patterns are data for nine high critical temperature super-conducting oxide related phases: (BaCuEr2O5, Ba2Cu3EuO7, BaCuGd2O5, Ba2Cu3GdO7, Ba2.4Cu5La4O13, Ba1.9cu3La1.1O7, Ba2Cu3SmO7 and (Ba0.4Sr0.6)2Cu3 YO7). The general methods of producing these X-ray powder diffraction reference patterns were described previously in this journal (Vol. 1, No. 1, pg. 40 (1986)). The symbols used in this article are defined in the PDF cards.

Standard X-Ray Diffraction Powder Patterns of Fourteen Ceramic Phases

Fourteen reference patterns of oxide ceramics are reported. Included in the fourteen reference patterns are data for two high critical temperature superconducting oxide related phases (BaCuHo2O5 and Ba2YCu3O6.56). The general methods of producing these X-ray powder diffraction reference patterns were described previously in this journal (Vol. 1, No. 1, pg. 40 (1986)).

Standard X-Ray Diffraction Powder Patterns of Fourteen Ceramic Phases

The following fourteen reference patterns of boride, telluride, and oxide ceramics are reported. Included in the fourteen reference patterns are data for six high Tc superconducting oxide and related phases (Ba2CaCu2TI2O8, BaCuEu2O5, BaCuTm2O5, BaCuDy2O5, Ba3.2Cu1.7Y0.8O6.1·xCO2, Sr2Bi2O5). The general methods of producing these X-ray powder diffraction reference patterns are described in this journal, Vol. 1, No. 1, pg. 40 (1986).Samples were mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2θ values for these internal standards are specified in the methods described (ibid.). Data were measured with a computer controlled step-scanning diffractometer. The POWDER-PATTERN system of computer programs was used to locate peak positions, to calibrate the patterns, and to perform variable indexing and least-squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer method.Intensities were measured as peak heights above background and were read manually from strip charts. To minimize preferred orientation effects, the powders were passed through a 400 mesh sieve and were mixed with an amorphous diluent, silica gel. Sample mounts were prepared by side-drifting and/or by dusting a thin layer of sample on a glass slide coated with a thin smear of silicone grease.

Standard X-Ray Diffraction Powder Patterns of Fourteen Ceramic Phases

The following fourteen reference patterns of carbide, nitride, telluride, and oxide ceramics are reported. Included in the fourteen reference patterns are data for three high Tc superconducting oxide related phases (Ba2CuO3, CuSrO2, and Ba2Cu3YO6). The general methods of producing these X-ray powder diffraction reference patterns are described in this journal, Vol. 1, No. 1, pg. 40 (1986).Samples were mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2θ values for these internal standards are specified in the methods described (ibid.). Data were measured with a computer controlled diffractometer. The POWDER-PATTERN system of computer programs was used to locate peak positions, to calibrate the patterns, and to perform variable indexing and least-squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

Standard X-Ray Diffraction Powder Patterns of Fifteen Ceramic Phases

AbstractFifteen reference patterns of oxides, nitrides, borides, carbides, silicides, and sulfides are included in this report. The general methods of producing these X-ray powder diffraction reference patterns are described in this Journal, Vol. 1, No. 1, pg. 40(1986).Samples were mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2θ values for these internal standards are specified in the methods described (ibid.). Data were measured with a computer controlled diffractometer. The POWDER-PATTERN system of computer programs was used to locate peak positions, to calibrate the patterns, and to perform indexing and least-squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.Intensities were measured as peak heights above background and were read manually from strip charts. To minimize preferred orientation effects, the powders were passed through a 400 mesh sieve and were mixed with an amorphous diluent material, glass powder. Samples were prepared by side-drifting the mixture into the holder or by dusting a thin layer on a glass slide coated with a thin smear of silicone grease.The support and interest of the ICDD in this project is gratefully acknowledged. The expert guidance of R. Roth of the Ceramics Division on material synthesis and the careful review of the manuscript by S. Block of the Ceramics Division and A. D. Mighell of the Reactor Division are fully appreciated. Acknowledgement is also extended to D. Minor for performing sample analysis by using SEM. In the production of these standard powder patterns, the ability to search NBS CRYSTAL DATA has proven invaluable.

Standard X-Ray Diffraction Powder Patterns of Fifteen Ceramic Phases

The following fifteen reference patterns of boride, silicide and oxide ceramics represent the first group of ceramic phases measured at the National Bureau of Standards under the project “High Quality Reference Patterns and Total Digital Powder Patterns of Technologically Important Ceramic Phases”. The support and interest of the JCPDS-ICDD in this project is gratefully acknowledged.The general methods of producing these X-ray powder diffraction reference patterns are described in this journal, Vol. 1, No. 1, pg. 40(1986).

Standard X-Ray Diffraction Powder Patterns from The JCPDS Research Associateship

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).The data for each phase apply to the specific sample described. A sample was mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data, from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

Standard X-Ray Diffraction Powder Patterns from the JCPDS Research Associateship

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).The data for each phase apply to the specific sample described. A sample was mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data, from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

Standard X-Ray Diffraction Powder Patterns from The JCPDS Research Associateship

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).The data for each phase apply to the specific sample described. A sample was mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data, from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement.

Standard X-Ray Diffraction Powder Patterns from the JCPDS Research Associateship

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).The data for each phase apply to the specific sample described. A sample was mixed with 1 or 2 internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

Standard X-ray diffraction powder patterns : 70 substances are analysed, 52 represent experimental data and 18 are calculated US. Nat. Bur. Stand. Monograph. Sect. 11, N25, 1974, 134P Swanson H.E., McMurdie H.F., Morris M.C.

Standard X-ray diffraction powder patterns : 70 substances are analysed, 52 represent experimental data and 18 are calculated US. Nat. Bur. Stand. Monograph. Sect. 11, N25, 1974, 134P Swanson H.E., McMurdie H.F., Morris M.C.

Standard X-ray diffraction powder patterns. Section 11by H. E. Swanson, H. F. McMurdie, M. C. Morris, E. H. Evans and B. Paretzkin

<i>Standard X-ray diffraction powder patterns. Section 11</i>by H. E. Swanson, H. F. McMurdie, M. C. Morris, E. H. Evans and B. Paretzkin

Standard x-ray diffraction powder patterns

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