Abstract An INDO calculation using the RHF/CI method indicates that the minimum energy conformation of the [XCH2CONH2]− radical anions where X = F, C1, Br and I occurs if the C-X bond is located in a direction approximately normal to the CON plane. It has been experimentally shown that for these radical anions to be observed in single crystals by EPR methods, the molecular precursor should not exist in the energy maximum conformation for radical anions or else spontaneous elimination of X− occurs upon electron attachment. This suggests that F− elimination from dopants (e.g. AsF5) used in the formation of conducting polymers may be a general phenomenon if the anion is formed from a maximum energy configuration.