The development of hard magnetic properties in Nd-Fe-B films with a thickness below 50 nm has been studied and the effect of the film strain on the spin reorientation transition temperature (TSR) evaluated. A value of 35 nm is found to be the lowest thickness threshold in the films grown by DC magnetron sputtering in this study for the full development of both the Nd2Fe14B phase and the broadening of the out of plane hysteresis loops. Large perpendicular magnetic anisotropy is obtained for a film of 40 nm in thickness, reaching a coercivity of 8 kOe at room temperature. A detailed characterization of epitaxial Nd2Fe14B with high magnetic anisotropy has been done by Grazing Incidence X-Ray Diffraction, lattice parameters are reported and the chemical states of Nd 3d and Fe 2p have been stablished by the analysis of Hard X-Rays Photoelectron Spectroscopy spectra. The spin reorientation transition temperature has been estimated to a value of 124.2 K. Based on experimental results, lattice strain is attributed as the main reason for the deviation of TSR by comparison with the theoretical value (135 K). No evidence of tetragonal distortion in the lattice is found below TSR in this system in contrast to previous considerations.
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