Aerospace and defense applications present unique challenges for material suppliers. As increasing adoption of advanced semiconductor materials and Diverse Accessible Heterogeneous Integration technologies, power density of defense and aerospace devices increases rapidly. Traditional die-attaching technology is becoming an increasingly limiting factor in microelectronics packaging for the next generation aerospace and defense systems. Metal particle sintering creates a porous metal foam, which can significantly enhance heat transfer within the sintered material. However, the traditional silver sintering requires very high sintering temperatures that cannot be tolerated by typical microelectronics devices. In addition, the sintered metal foam contains open-cell pores that can absorb/entrap moisture and dusts, which poses a reliability risk. This article introduces an advanced hybrid silver sintering material, which incorporates highperformance silver sintering with high reliability and process-friendly of epoxy-based die-attaching technology. This hybrid sintering paste can be processed without applying any pressures in temperature ranges that are normal in microelectronics packaging processes. Preliminary experimental studies, including Scanning Electron Microscopic study, volume resistivity tests, die shear strength tests, and thermal resistance tests, were performed for developing a low temperature sintering schedule that is compatible with normal assembly processes of high-power density electronics devices. The results indicated that the hybrid material could achieve silver sintering at 150 degrees C and offer 36 enhancement on thermal performance comparing with a widely used die-attach material.