Near-infrared light detectors are employed in various fields such as food inspection for spectroscopic measurements. Despite the fact that photodiodes made of compound semiconductors are used in conjunction with optical filters or monochromators for highly sensitive and wavelength-selective detection of near-infrared light, improvements in device size and cost are necessary for widespread application. Therefore, we propose the use of silicon microelectromechanical systems (MEMS) sensors. This study proposes a single-crystalline Si electrostatic MEMS resonator sensor that is integrated with a gold nanostructure near-infrared light absorber. The device utilizes the resonance frequency shift that occurs due to the thermal stress caused by the heat generated by the near-infrared light on the resonator. A gold nanostructure absorber is mounted on the resonator to enhance photothermal conversion efficiency, enabling the detection of near-infrared light with wavelength selectivity. We fabricated an Au nanostructure-mounted electrostatic transducer and evaluated its performance by measuring its resonance under near-infrared light irradiation. In a light intensity detection experiment, it was found that the relative resonant frequency shift increased linearly with the input in the range below 100 μW, which is consistent with the trend against the input heat. The minimum detection resolution of the light intensity was approximately 5 nW, and the minimum detectable intensity was 3.8 nW. The linear relationship between the optical absorption coefficient and the relative resonance frequency shift was clarified. An array of the devices with different absorption wavelength bands can be used to realize an ultra-compact spectroscopic analysis device without the need for traditional optical filters or monochromators.