The analysis of the light response of thallium-doped cesium iodide to gamma radiation was performed on single scintillation waveforms recorded using a digital oscilloscope. As an alternative to classical pulse processing procedures, the use of dynamic integration times instead of fixed shaping/integration times was demonstrated. The dynamic integration time, changeable with the amplitudes of the CsI:Tl scintillation pulses, allowed to optimise the light collection with simultaneous minimization of a noise contribution. It was shown that for low-energy γ-rays (22 keV–60 keV), the scintillation pulses should be integrated using shorter integration times (approximately 7 μs–14 μs), whereas for higher energies (662 keV–835 keV), the best energy resolution was achieved with integration times of about 28 μs–30 μs. The approach also allowed for the registration of more proportional CsI:Tl light responses to deposited X and gamma radiation in the energy range of 22 keV–835 keV.
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