Scanning Probe Microscopy System Research Articles

Design and realization of scanning probe microscope based on a T-shaped high-aspect-ratio probe

With the growing importance of three-dimensional (3D) nanomaterials and devices, the use of high-aspect-ratio (HAR) probes in atomic force microscopy (AFM) imaging enables full-profile topography characterization. However, HAR-AFM probes are difficult to manufacture due to the expensive materials and complex processes. Inspired by the Wollaston scanning probe, we successfully fabricated a T-shaped tungsten probe and installed in a home-made scanning probe microscope system. Compared with commercial AFM, the home-made platform utilizes a set of LabVIEW control programs based on field programmable gate array hardware feedback, which improves the scanning speed and makes the control program more flexible. The reliability of the system was verified by comparing with the scanning results of commercial AFM. The T-shaped probe exhibits better fidelity in HAR-hole imaging compared to AFM standard pyramidal probes. This approach will likely find a convenient and material-saving fabrication route, especially for custom functional nanoprobes.

Development of a cryogen-free sub-3K low-temperature scanning probe microscope by remote liquefaction scheme.

We developed a new scheme for cryogen-free cooling down to sub-3K temperature range and ultra-low vibration level. An ultra-high-vacuum cryogen-free scanning probe microscope (SPM) system was built based on the new scheme. Instead of mounting a below-decoupled cryocooler directly onto the system, the new design was realized by integrating a Gifford-McMahon cryocooler into a separate liquefying chamber, providing two-stage heat exchangers in a remote way. About 10 L of helium gas inside the gas handling system was cooled, liquefied in the liquefying chamber, and then transferred to a continuous-flow cryostat on the SPM chamber through an ∼2m flexible helium transfer line. The exhausted helium gas from the continuous-flow cryostat was then returned to the liquefying chamber for reliquefaction. A base temperature of ∼2.84K at the scanner sample stage and a temperature fluctuation of almost within ±0.1 mK at 4K were achieved. The cooling curves, tunneling current noise, variable-temperature test, scanning tunneling microscopy and non-contact atomic force microscopy imaging, and first and second derivatives of I(V) spectra are characterized to verify that the performance of our cryogen-free SPM system is comparable to the bath cryostat-based low-temperature SPM system. This remote liquefaction close-cycle scheme shows conveniency to upgrade the existing bath cryostat-based SPM system, upgradeability of realizing even lower temperature down to sub-1K range, and great compatibility of other physical environments, such as high magnetic field and optical accesses. We believe that the new scheme could also pave a way for other cryogenic applications requiring low temperature but sensitive to vibration.

Tunable Spatial Resolution of a Scanning Probe Microscopy (SPM) by an Efficient Cryosorption Pump

Scanning Probe Microscopy (SPM) is a useful instrument to study the surface topography of the sample at an atomic resolution. SPM system is sensitive to vibration and contamination on the surface, and therefore a vibration-free and clean environment are required to improve spatial resolution in Z-height. In this paper, a detailed new design of stand alone cost effective, vibration free activated carbon based cryosorption pump integrated and its detailed integration with SPM system is discussed. The efficiency of cryosorption pump depends on the radial temperature distribution, which was analysed using transient thermal analysis in Ansys software. The temperature profile obtained from the thermal simulation results reveals that a spiral wound copper mesh based partition surrounding the activated carbon in cryosorption pump improves the temperature distribution in the radial direction. The pump can operate with a maximum of 25 litres of Liquid nitrogen consumption and 4.5 hrs of continuous operation. The activated carbon was used as an adsorbent showed a hexagonal crystal structure from the X-Ray Diffraction (XRD) studies and its average pore size was obtained from by Brunauer-Emmett-Teller (BET) analysis was 0.34 nm. These tests were conducted to determine the effect on the pump-down characteristics of developed cryosorption pump. The improvement in spatial resolution was studied through detailed experimental analysis in Conductive Atomic Force Mode (CAFM) by Piezo Force Microscopy (PFM) which showed a 50 percent decrease of the current when imaged in a vacuum environment, phase and magnitude images showed the less distorted and clear visibility of the piezo domains. The magnetic interaction by Magnetic Force Microscopy (MFM) Q-factor was studied at the resonance frequency of 61.5 kHz. MFM showed that the Q-factor improved from 20 to 500 at 1E-3 mbar operating pressure. The drift of the MFM tip with respect to holding time showed a saturated Q-factor at 500. Non-contact mode by Atomic Force Microscopy (AFM) showed a spatial resolution enhancement of 0.89 nm.

Development of a near-5-Kelvin, cryogen-free, pulse-tube refrigerator-based scanning probe microscope.

We report the design and performance of a cryogen-free, pulse-tube refrigerator (PTR)-based scanning probe microscopy (SPM) system capable of operating at a base temperature of near 5 K. We achieve this by combining a home-made interface design between the PTR cold head and the SPM head, with an automatic gas-handling system. The interface design isolates the PTR vibrations by a combination of polytetrafluoroethylene and stainless-steel bellows and by placing the SPM head on a passive vibration isolation table via two cold stages that are connected to thermal radiation shields using copper heat links. The gas-handling system regulates the helium heat-exchange gas pressures, facilitating both the cooldown to and maintenance of the base temperature. We discuss the effects of each component using measured vibration, current-noise, temperature, and pressure data. We demonstrate that our SPM system performance is comparable to known liquid-helium-based systems with the measurements of the superconducting gap spectrum of Pb, atomic-resolution scanning tunneling microscopy image and quasiparticle interference pattern of Au(111) surface, and non-contact atomic force microscopy image of NaCl(100) surface. Without the need for cryogen refills, the present SPM system enables uninterrupted low-temperature measurements.

Developing Low-Profile Deflectometer for Combined Scanning Probe and Optical Microscopy Systems

Developing Low-Profile Deflectometer for Combined Scanning Probe and Optical Microscopy Systems

Optomechanical atomic force microscope

In the scanning probe microscope system, the weak signal detection of cantilever vibration is one of the important factors affecting the sensor sensitivity. In our current work, we present a novel design concept for an atomic force microscope (AFM) combined with optomechanics with an ultra-high quality factor and a low thermal noise. The detection system consists of a fixed mirror placed on the cantilever of the AFM and pump-probe beams that is equivalent to a Fabry–Perot cavity. We realize that the AFM combined with an optical cavity can achieve ultra-sensitive detection of force gradients of 10−12 N m−1 in the case of high-vacuum and low effective temperature of 1 mK, which may open up new avenues for super-high resolution imaging and super-high precision force spectroscopy.

Validity of Three-Dimensional Tortuous Pore Structure and Fouling of Hemoconcentration Capillary Membrane Using the Tortuous Pore Diffusion Model and Scanning Probe Microscopy.

Hemoconcentration membranes used in cardiopulmonary bypass require a pore structure design with high pure water permeability, which does not allow excessive protein adsorption and useful protein loss. However, studies on hemoconcentration membranes have not been conducted yet. The purpose of this study was to analyze three-dimensional pore structures and protein fouling before and after blood contact with capillary membranes using the tortuous pore diffusion model and a scanning probe microscope system. We examined two commercially available capillary membranes of similar polymer composition that are successfully used in hemoconcentration clinically. Assuming the conditions of actual use in cardiopulmonary bypass, bovine blood was perfused inside the lumens of these membranes. Pure water permeability before and after bovine blood perfusion was measured using dead-end filtration. The scanning probe microscopy system was used for analysis. High-resolution three-dimensional pore structures on the inner surface of the membranes were observed before blood contact. On the other hand, many pore structures after blood contact could not be observed due to protein fouling. The pore diameters calculated by the tortuous pore diffusion model and scanning probe microscopy were mostly similar and could be validated reciprocally. Achievable pure water permeabilities showed no difference, despite protein fouling on the pore inlets (membrane surface). In addition, low values of albumin sieving coefficient are attributable to protein fouling that occurs on the membrane surface. Therefore, it is essential to design the membrane structure that provides the appropriate control of fouling. The characteristics of the hemoconcentration membranes examined in this study are suitable for clinical use.

ARMScope – the versatile platform for scanning probe microscopy systems

ARMScope – the versatile platform for scanning probe microscopy systems

3D-Printed Scanning-Probe Microscopes with Integrated Optical Actuation and Read-Out.

Scanning-probe microscopy (SPM) is the method of choice for high-resolution imaging of surfaces in science and industry. However, SPM systems are still considered as rather complex and costly scientific instruments, realized by delicate combinations of microscopic cantilevers, nanoscopic tips, and macroscopic read-out units that require high-precision alignment prior to use. This study introduces a concept of ultra-compact SPM engines that combine cantilevers, tips, and a wide variety of actuator and read-out elements into one single monolithic structure. The devices are fabricated by multiphoton laser lithography as it is a particularly flexible and accurate additive nanofabrication technique. The resulting SPM engines are operated by optical actuation and read-out without manual alignment of individual components. The viability of the concept is demonstrated in a series of experiments that range from atomic-force microscopy engines offering atomic step height resolution, their operation in fluids, and to 3D printed scanning near-field optical microscopy. The presented approach is amenable to wafer-scale mass fabrication of SPM arrays and capable to unlock a wide range of novel applications that are inaccessible by current approaches to build SPMs.

Scanning probe microscopy for advanced nanoelectronics

As the size of electronic devices continues to shrink, characterization methods capable of precisely probing localized properties become increasingly important. Scanning probe microscopy techniques can examine local phenomena, and conductive atomic force microscopy can, in particular, study local electromechanical properties. Such techniques have already played a valuable role in the development of nanoelectronics, but their capabilities remain relatively limited compared with the probe stations typically used to examine electronic devices. Here, we discuss the potential of conductive atomic force microscopy in nanoelectronics. We explore possible characterization strategies, enhanced electronics for the technique and improved multiprobe approaches. We also propose a multiprobe scanning probe microscopy system that combines different types of probes and could allow multiple nanofabrication and characterization experiments to be carried out simultaneously and under vacuum conditions. This Perspective examines the potential role of conductive atomic force microscopy in the development of nanoelectronics, exploring possible characterization strategies, enhanced electronics for the technique and improved multiprobe approaches.

A novel stable nanopositioner based on a single piezoelectric stack: PistolDrive

We describe a novel stable piezoelectric nanopositioner which just use one piezoelectric stack and one simple driving signal, in which the central shaft is clamped by one BeCu spring and four SiN balls that bonded to the inner wall of the cylindrical tube. The cylindrical tube is fixed on the free end of the piezoelectric stack. Applying one increasing voltage signal on the piezoelectric stack, according to the principle of piezoelectricity, the piezoelectric stack will extend smoothly. When canceling this voltage signal suddenly, the piezoelectric will recover to its original length while the central shaft will keep stationary for its inertance. So, the central shaft will be sliding a small distance relative to the piezoelectric stack. Normally, the heavier of the central shaft, the better moving stability, resulting in a high output force of the nanopositioner. Because of the simple structure, simple working principle and good mechanical stability, our novel nanopositioner can be easily used in Scanning Probe Microscopy system and Active Optical mirror adjustment system in large scale astronomical telescope.

A low-temperature scanning probe microscopy system with molecular beam epitaxy and optical access.

A low-temperature ultra-high vacuum scanning probe microscopy (SPM) system with molecular beam epitaxy (MBE) capability and optical access was conceived, built, and tested in our lab. The design of the whole system is discussed here, with special emphasis on some critical parts. The SPM scanner head takes a modified Pan-type design with improved rigidity and compatible configuration to optical access and can accommodate both scanning tunneling microscope (STM) tips and tuning-fork based qPlus sensors. In the system, the scanner head is enclosed by a double-layer cold room under a bath type cryostat. Two piezo-actuated focus-lens stages are mounted on both sides of the cold room to couple light in and out. The optical design ensures the system's forward compatibility to the development of photo-assisted STM techniques. To test the system's performance, we conducted STM and spectroscopy studies. The herringbone reconstruction and atomic structure of an Au(111) surface were clearly resolved. The dI/dV spectra of an Au(111) surface were obtained at 5 K. In addition, a periodic 2D tellurium (Te) structure was grown on the Au(111) surface using MBE and the atomic structure is clearly resolved by using STM.

Large-area diamond thin film on Q-carbon coated crystalline sapphire by HFCVD

The growth of diamond on transparent substrates like sapphire presents a great challenge because of the large thermal misfit between the film and the substrate, absence of any carbide layer during diamond growth, and low nucleation density during chemical vapor deposition (CVD) growth process. In this study, we report on the use and the role of Q-carbon as an intermediate layer to successfully deposit large-area diamond film on c-sapphire by hot filament chemical vapor deposition (HFCVD). The Q-carbon consists of very high-density diamond tetrahedra which act as the embryo for diamond nucleation. Different techniques such as X-ray diffraction, scanning electron microscopy, and Raman spectroscopy show that continuous diamond films with good crystallinity and without any impurity phase can be deposited on the Q-carbon coated single crystal sapphire substrate. The Q-carbon layer is very adherent and it negates the thermal mismatch between the diamond film and the sapphire substrate. A small blue shift in the Raman peak of the diamond from its equilibrium position suggests the deposition of the CVD diamond film with minimal stress (1.14 GPa). This technique of growing large-area continuous diamond thin film with excellent crystalline quality on a single crystal sapphire substrate can serve as a platform for the development of next-generation corrosion and erosion resistant infrared windows, state-of-the-art optoelectronic devices, and advanced scanning probe microscopy systems.

(Invited) Operando Characterization of Energy Conversion and Storage Devices Using Scanning Probe Microscopy

Energy conversion/storage devices, such as solar cells (SCs) and lithium ion batteries (LIBs), have been actively researched along with the growing interest in energy and environment issues. In order to further improve the performance of these devices, it is essential to have a deeper understanding of their working principles. To achieve this, the characterization of their physical and chemical properties under device operation conditions, so-called operando measurement, is thought to be highly effective. For example, in the case of SCs, important information related with photovoltaic conversion processes can be obtained by measuring the electrical potential, electronic states, and charge distribution in the vicinity of the excitation center under light irradiation conditions. In the case of LIBs, characterization of electrical potential and lithium ion distribution in the electrodes and electrode-electrolyte interfaces during charging and discharging processes is expected to provide strong insight into the origin of interface resistance and mechanism of cell degradation. Up to date, X-ray and electron spectroscopy techniques have led the field of operando measurement. However, the spatial resolution of those techniques is insufficient to characterize next generation devices that actively utilize nanostructure. Thus, in our group, as an operando measurement technique to evaluate the local properties at nanoscale and even down to the atomic scale, we have been working on developing scanning probe microscopy (SPM) systems that operate under various environments (under light irradiation, voltage application, inert atmospheric conditions). In this talk, we will introduce recent our works related to the characterization of perovskite SCs and all-solid-state LIBs by operando nano-scale profiling of electrical potential distribution using Kelvin probe force microscopy (KPFM). Perovskite solar cells (PSCs) have attracted great research interest owing to their advantages in high power conversion efficiency and low-cost fabrication. Although the power conversion efficiency of PSCs is very high (record is 22.7 %), the detailed photovoltaic conversion processes has not well understood yet compared with the conventional inorganic SCs. In this work, we used KPFM to measure internal electrical potential distribution of PSCs during device operation. We observed that the change of electrical potential induced by illumination occurred strongly at the interface between the perovskite film and charge transport layers, which suggests that charge separation mainly occurred at those interfaces, not in the perovskite film. Also, we found that the position of charge separation varied depending on the composition of perovskite materials and the device structure. These findings will be helpful for understanding the fundamental mechanism within PSCs and achieving high device efficiency. All-solid-state (ASS) LIBs are a promising candidate for next-generation energy storage devices. However, solid electrolytes for the current ASS-LIBs have various disadvantages, such as low power densities caused by high ionic resistivity at the interfaces between active materials and solid electrolytes. The high ionic resistivity has been attributed to the Li depleted layer or defects at the interfacial layer. For the fundamental understanding of the origin of interfacial resistivity, novel in situ techniques for measuring the distribution of the internal potential and/or Li ion concentration of LIB cells are strongly required. In this work, we combined Ar ion milling under non-atmospheric conditions with cross-sectional KPFM for direct imaging of the internal electrical potential distribution of the ASS-LIBs. We succeeded in the direct visualization of the change in the potential distribution of the cathode composite electrode arising from the battery charging (electrochemical reaction). The results obtained provided several insights into the battery operation, such as the behavior of Li ions and inhomogeneity of electrochemical reactions in the electrode.

A micro-SQUID with dispersive readout for magnetic scanning microscopy

We have designed and characterized a micro-SQUID with dispersive readout for use in low temperature scanning probe microscopy systems. The design features a capacitively shunted RF SQUID with a tunable resonance frequency from 5 to 12 GHz, micrometer spatial resolution, and integrated superconducting coils for local application of magnetic fields. The SQUID is operated as a nonlinear oscillator with a flux- and power-dependent resonance frequency. Measurements for device characterization and noise benchmarking were carried out at 4 K. The measured flux noise above 10 kHz at 4 K is 80 nΦ0 Hz−1∕2 at a bandwidth of 200 MHz. Estimations suggest that one can benefit from parametric gain based on inherent nonlinearity of the Josephson junction and reduce the flux noise to 30 nΦ0Hz–1∕2 at 100 mK, which corresponds to 10.6 μBHz–1∕2 for a magnetic moment located at the center of the pickup loop.

Advances in micro-SQUID design could detect and manipulate single electrons

Enhanced spatial resolution in newly designed scanning probe microscopy system may help researchers observe quantum coherent phenomenon at the mesoscale.

Switching of both local ferroelectric and magnetic domains in multiferroic Bi0.9La0.1FeO3 thin film by mechanical force

Cross-coupling of ordering parameters in multiferroic materials by multiple external stimuli other than electric field and magnetic field is highly desirable from both practical application and fundamental study points of view. Recently, mechanical force has attracted great attention in switching of ferroic ordering parameters via electro-elastic coupling in ferroelectric materials. In this work, mechanical force induced both polarization and magnetization switching were visualized in a polycrystalline multiferroic Bi0.9La0.1FeO3 thin film using a scanning probe microscopy system. The piezoresponse force microscopy and magnetic force microscopy responses suggest that both the ferroelectric domains and the magnetic domains in Bi0.9La0.1FeO3 film could be switched by mechanical force as well as by electric field. High tip stress applied on our thin film is demonstrated as able to induce ferroelastic switching and thus induce both ferroelectric dipole and magnetic spin flipping, as a consequence of electro-elastic coupling and magneto-electric coupling. The demonstration of mechanical force control of both the ferroelectric and the magnetic domains at room temperature provides a new freedom for manipulation of multiferroics and could result in devices with novel functionalities.

Advanced atomic force microscopy techniques III.

Surface science and nanotechnology are inherently coupled because of the increased surface-to-volume ratio at the nanometer scale. Most of the exciting and astonishing properties of nanoscale materials are related to certain surface reconstructions and nanoscale geometries. New functionality is achieved by combinations of nanoscale materials or by structuring their surfaces. The unrivaled tools for measurements of all kind of nanoscale properties are scanning probe microscopy (SPM) techniques, which were triggered by the invention of the scanning tunneling microscope (STM) in 1982 [1–3] and of the atomic force microscope (AFM) in 1986 [4]. These tools opened a huge field of nanoscale studies, from metal surfaces and clusters, molecular structures, insulators to liquid and electrochemical environments and even allowed the integration of various SPM techniques into biological and chemical experiments. The second volume of the Thematic Series “Advanced atomic force microscopy techniques”, which is presented here, compiles again exciting developments in nanoscale research based on SPM techniques addressed by the scientific community within the last years. Similar to the first volume [5], the development of advanced techniques and their application is the focus of this Thematic Series. Contributions related to energy conversion and storage systems have been addressed, e.g., the analysis of cathodes of lithium–sulfur batteries for a comparison of their nanoscale electrical, electrochemical, and morphological properties [6] or the analysis of CdS quantum dots on TiO2 by a combination of AFM and X-ray photoelectron spectroscopy [7]. The folding and rupture of graphene on SiC analyzed by non-contact AFM and Kelvin probe force microscopy [8] are presented as well as molecular structures such as the self-assembly of multidentate organothiols onto Au(111), which were studied in situ by using scanning probe nanolithography and time-lapse AFM [9]. Patterns of thiol-based self-assembled monolayers for the site-selective growth of metal-organic frameworks have been created and analyzed by a nanografting technique by using an AFM as a structuring tool [10]. The effect of Cu intercalation at the interface of self-assembled monolayers and a Au(111)/mica substrate was analyzed by STM [11] as well as the growth behavior of PTCDA islands [12]. Furthermore, the analysis of mechanical properties of either nanoparticles [13] or biological systems [14–16] is covered by several articles and reviewed by Cohen and co-workers [17]. Especially the application of advanced SPM techniques in biology provides exciting new results and clearly shows a route for development for the next years. All of the new applications and experiments are strongly dependent on theoretical and technical developments. Virtual AFMs used to simulate AFM measurements [18–20] and to deconvolute complex correlations between various surface properties [21] are based on the implementation of proportional-integral controllers to give realistic feedback behaviours. Stirling proposed a theoretical model for studying the SPM feedback in the context of control theory providing the possibility to understand and model the performance from SPM systems with real parameters [22]. Furthermore, technical contributions discuss the impact of thermal frequency drift of quartz-based force sensors at low temperatures to the accuracy of the force measurements [23] and the trade-offs in sensitivity and sampling depth in bimodal and trimodal AFM [24]. The examples mentioned give a first impression of this collection of high quality research provided to the Beilstein Journal of Nanotechnology, the open-access journal for publication and dissemination of nanoscience research results. We are convinced that the articles presented here will stimulate new ideas in the research field. We would like to thank all of the authors for their excellent contributions and the referees for their comprehensive and valuable reports, sustaining a journal that is attractive for contributors. Finally, we would also like to thank the team at the Beilstein-Institut for their excellent support and acknowledge the open-access policy of the Beilstein Journal of Nanotechnology, which provides the professional framework and support allowing the collection, review, publishing, and distribution of research results in an easy and excellent way. Thilo Glatzel, Ricardo Garcia & Thomas Schimmel November 2014

A Scanning Probe Microscope for Surface Measurement in Nano-Scale.

A tapping mode scanning probe microscopy (TM SPM) system for surface measurement in nanoscale is developed, of which the main element is a scanning probe consisting of quartz tuning fork and a long sharp tungsten tip. Quartz tuning fork is a very good resonant element with piezoelectrical characteristic, and it acts as an actuator and a force sensor simultaneously in the probe. The vertical spatial resolution of the TM SPM is up to sub-nanometer (0.11 nm) and the measuring force is in micro Newton magnitude (about 30 μN). In the scanning operation, the probe vibrates at its resonant frequency, so that the amplitude or frequency (or phase) of the resonant tuning fork is very sensitive to external forces (Its quality factor in air is about 3138). Using the TM SPM constructed by this probe, silicon samples are scanned. Their topography and phase images which indicate the surface material characteristics are reconstructed effectively with a high resolution and low destructiveness. Soft materials, such as Protein structure can also be scanned theoretically without damage. In addition, because of the using of the long sharp tungsten tip, the system has the capacity of measuring micro structures with large aspect ratio, such as large micro steps, deep micro trenches, etc.

Scanning Probe-Based in-Situ High Temperature Electrical and Electrochemical Studies

Scanning Probe Microscopy (SPM) is arguably the only tool that is available for direct nanoscale electrical and electrochemical characterization since electrical measurement through a highly localized area necessitates a nanoscale electrode. However, conventional SPM systems are functional only up to ~250°C under atmospheric pressure because significant heat convection from the heating stage to thermally-sensitive system modules disturbs a stable operation1,2. In operando observations of non-vacuum processes necessitating a much higher temperature, e.g. solid oxide-based electrochemical reactions and phase changes, have been largely limited. To address these problems, we have developed micro-thermal stage (MTS)3 in which the heating element is on the micrometer scale with an area roughly a million times smaller than that of a conventional SPM heating stage. We also prepared SPM probes custom-made to suppress thermal degradation during high temperature operation. At high temperature, metal-coated SPM tips tend to degrade at a faster rate, resulting in erroneous observations. The modified SPM setup was applied to study thermally activated bonding formation and highly localized oxygen reduction reaction kinetics on a solid oxide electrolyte. For the MTS, Pt is micro-patterned on a silicon chip as the heating element and a thin film-based layer of study are deposited on top of the heating element after electrical passivation. The temperature of the Pt heater can be determined by the measured electrical resistance of the heater because the resistance of a metal linearly increases with temperature4. A four-probe measurement scheme is integrated onto the chip for sensing the resistance and corresponding temperature of the heating element. The temperature of the heater is feedback controlled. Due to the small size of the heating element and small sample thickness, the desired temperature can be reached and controlled in milliseconds. To circumvent the degradation issue of Pt-coated tip, an all-metal tip is custom-made from Pt-Ir wire by electrochemical etching method, from which tip radii less than 100 nm can be routinely achieved. The non-etched part of the wire is flattened and polished to mount on an SPM system. After verifying the functionality of the Pt-Ir SPM tip through routine SPM contact mode scanning, we used the modified setup to study localized in-situ oxygen reduction catalysis and ionic transport on a platinum/yttria-stabilized ceria (Pt/YSZ) half cell. The aforementioned modified SPM setup has potential to be used in many other applications, such as in-situ observation of changes in mechanical, electrical and thermal properties at the tip-sample interfaces under high-temperature and high-pressure conditions. Research supported by the AFOSR (Grant # FA9550-15-1-0256), USA and MoE AcRF Tier 2 (Grant # ARC20/14), Singapore. 1 J. Broekmaat, A. Brinkman, D.H.A. Blank, and G. Rijnders, Appl. Phys. Lett. 92, (2008). 2 K. V Hansen, T. Jacobsen, A.M. Norgaard, N. Ohmer, and M. Mogensen, Electrochem. Solid State Lett. 12, B144 (2009). 3 J. Lee, S. Kim, R. Jeyasingh, M. Asheghi, H.-S.P. Wong, and K.E. Goodson, IEEE Electron Device Lett. 32, 952 (2011). 4 R.B. Belser and W.H. Hicklin, J. Appl. Phys. 30, 313 (1959). Figure 1