In solidly mounted resonator (SMR) type of bulk acoustic wave resonator, it is difficult to fabricate single crystalline piezoelectric thin films in a bottom-up process due to the amorphous SiO2 in the low acoustic impedance layer of the acoustic Bragg reflector. In this study, single crystalline ZnO piezoelectric layer on amorphous SiO2/polycrystalline Mo acoustic Bragg reflector is fabricated using a wet etching process of the epitaxial Au sacrificial layer. Epitaxial growth of ZnO was confirmed by X-ray diffraction pole figure and transmission electron microscope electron diffraction pattern. Resonance frequency of 1.3 GHz of epitaxial ZnO SMR was observed using a network analyzer.
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