Results Of Cross-sectional Observations Research Articles

Measurement of deuterium and helium by glow-discharge optical emission spectroscopy for plasma–surface interaction studies

To examine the resolution of isotope analysis of hydrogen with glow-discharge optical emission spectroscopy (GDOES), depth profiles of hydrogen and deuterium in a H-containing Ta/D-containing Ti/Ni layered structure were measured. The depth profiles of deuterium could be measured with sufficient resolution in the presence of relatively large amounts of hydrogen and vice versa. In addition, measurements of depth profiles of He implanted in W at room temperature were also performed with Ne plasma. The intensity of the He emissions was sufficiently high at a fluence of 1020 Hem−2 or higher. The depth profiles of He measured in this manner were in good agreement with the results of cross-sectional observations using a transmission electron microscope. Therefore, it was concluded that GDOES with Ne plasma is a promising technique for the depth profile analysis of plasma-facing materials and deposited layers formed on them.

Surface chemical states and oxidation resistivity of ‘ecologically friendly’ semiconductor (β-FeSi 2) thin films

Surface chemical states and oxidation resistivity of the ‘ecologically friendly’ semiconductor β-FeSi 2 have been investigated. Previously, we studied β-FeSi 2 thin films prepared by the ion-beam sputter deposition method (IBSD) on an Si(100) substrate. Through these studies, it was observed that the oxidation of the formed FeSi 2 does not proceed so much even in the air atmosphere compared with elemental Si or Fe or other compound semiconductors. In the present study, the obtained films were analyzed by synchrotron–radiation X-ray photoelectron spectroscopy (SR-XPS) in order to obtain chemical states and depth profiles of films non-destructively. From the XPS spectra, the results indicated FeSi 2 films have strong oxidation resistivity. The XPS spectra reveal that oxidation resistivity is caused by a very thin SiO 2 layer covering the formed β-FeSi 2. The results of cross sectional observation by transmission electron microscope and surface morphological analysis by scanning electron microscope are consistent with the SR-XPS results.

Formation of self-aligned carbon nanotube films by surface decomposition of silicon carbide

A simple method of producing aligned carbon nanotube films and a mechanism for their formation are described. The alignment method is based on the self-organization by surface decomposition of a SiC wafer in a vacuum at a temperature between 1500 and 1700°C. From the results of cross-sectional observations by high-resolution transmission electron microscopy and analytical electron microscopy, the following formation mechanism is proposed: SiO gas molecules are generated by surface oxidation and graphite caps of 2-5 nm in size are formed by the bubbling of SiO gas on the surface, characterized by a (0001)SiC plane. Then carbon nanotubes grow in a vertical direction, eroding the SiC crystal during the continuous oxidation.

電子顕微鏡による紙の表面構造の研究 ６ 走査電子顕微鏡によるコーティングカラーの原紙内部へのしみ込み深度の測定

In previous paper, the correlation between base paper structure and penetration off coatings was studied by observing fiber interfaces of coated layers using the scanning electron microscope. In this paper, the profiles of coatings penetrated into base paper were obtained by stereo-microphotogrametry on the fiber interfaces of coated layers. The hand-coated papers were prepared from the two different types of base paper A and B Tow-sideness of base paper A was less, but that of B remarkable. Results have been summarized as follows ; (1) When smooth surface as top side of A and B as well as wire side of A was coated, coatings penetrated into the sheet 2030, μ deep from the surface. (2) When rough surface as wire side of B was coated, coatings penetrated into the sheet 45 μ deep from the surface. (3) These profiles of coatings penetration were consistent with the results of cross sectional observation by the scanning electron microscope.