A method to calculate the refractive-index profile of planar waveguides from near-field measurements is described. The method is based on a profile expansion in terms of orthonormal functions. Numerical simulations carried out on a symmetrical waveguide show that few-term expansions provide a satisfactory profile recovery. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 27: 197–201, 2000.